| Dielectric-Engineered High-Speed, Low-Power, Highly Reliable Charge Trap Flash-Based Synaptic Device for Neuromorphic Computing beyond Inference JP Kim, SK Kim, S Park, S Kuk, T Kim, BH Kim, SH Ahn, YH Cho, ... Nano Letters 23 (2), 451-461, 2023 | 10 | 2023 |
| Oxygen scavenging of HfZrO 2-based capacitors for improving ferroelectric properties BH Kim, S Kuk, SK Kim, JP Kim, DM Geum, SH Baek, SH Kim Nanoscale Advances 4 (19), 4114-4121, 2022 | 8 | 2022 |
| TiOx/Ti/TiOx Tri-Layer Film-Based Waveguide Bolometric Detector for On-Chip Si Photonic Sensor J Shim, J Lim, DM Geum, JB You, H Yoon, JP Kim, WJ Baek, JH Han, ... IEEE Transactions on Electron Devices 69 (4), 2151-2158, 2021 | 7 | 2021 |
| Heterogeneous 3D Sequential CFET with Ge (110) Nanosheet p-FET on Si (100) bulk n-FET by Direct Wafer Bonding SK Kim, HR Lim, J Jeong, SW Lee, JP Kim, J Jeong, BH Kim, SY Ahn, ... 2022 International Electron Devices Meeting (IEDM), 20.1. 1-20.1. 4, 2022 | 3 | 2022 |
| IL Scavenging and Recovery Strategies to Improve the Performance and Reliability of HZO-Based FeFETs BH Kim, SK Kim, S Kuk, YJ Suh, J Jeong, JP Kim, DM Geum, S Kim 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | 2 | 2023 |
| Strategy for 3D Ferroelectric Transistor: Critical Surface Orientation Dependence of HfZrOx on Si SH Kuk, JH Han, BH Kim, JP Kim, SH Kim 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2023 | 2 | 2023 |
| Oxygen Scavenging in HfZrOx‐Based n/p‐FeFETs for Switching Voltage Scaling and Endurance/Retention Improvement BH Kim, SH Kuk, SK Kim, JP Kim, YJ Suh, J Jeong, DM Geum, SH Baek, ... Advanced Electronic Materials 9 (5), 2201257, 2023 | 2 | 2023 |
| Effect of Scandium Insertion Into the Gate-Stack of Ferroelectric Field-Effect Transistors BH Kim, SH Kuk, SK Kim, JP Kim, YJ Suh, J Jeong, DM Geum, SH Baek, ... IEEE Transactions on Electron Devices 70 (4), 1996-2000, 2023 | 2 | 2023 |
| 3D Stackable Cryogenic InGaAs HEMT-Based DC and RF Multiplexer/Demultiplexer for Large-Scale Quantum Computing J Jeong, SK Kim, J Kim, J Lee, JP Kim, BH Kim, YJ Suh, DM Geum, ... 2022 International Electron Devices Meeting (IEDM), 4.5. 1-4.5. 4, 2022 | 2 | 2022 |
| TiOx/Ti/TiOx Film-based Waveguide Bolometric Detector for On-Chip Si Photonic Sensors J Shim, J Lim, DM Geum, JB You, H Yoon, JP Kim, WJ Baek, JH Han, ... 2021 IEEE International Electron Devices Meeting (IEDM), 9.1. 1-9.1. 4, 2021 | 2 | 2021 |
| Low Operating Voltage and Immediate Read‐After‐Write of HZO‐Based Si Ferroelectric Field‐Effect Transistors with High Endurance and Retention Characteristics BH Kim, SH Kuk, SK Kim, JP Kim, YJ Suh, J Jeong, CJ Lee, DM Geum, ... Advanced Electronic Materials 10 (1), 2300327, 2024 | 1 | 2024 |
| Cryogenic RF Transistors and Routing Circuits Based on 3D Stackable InGaAs HEMTs with Nb Superconductors for Large-Scale Quantum Signal Processing J Jeong, SK Kim, YJ Suh, J Lee, J Choi, J Park, JP Kim, BH Kim, Y Jo, ... 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2023 | 1 | 2023 |
| High-sensitivity waveguide-integrated bolometer based on free-carrier absorption for Si photonic sensors J Shim, J Lim, DM Geum, JB You, H Yoon, JP Kim, WJ Baek, I Kim, ... Optics Express 30 (23), 42663-42677, 2022 | 1 | 2022 |
| Capacitor-Less 4F DRAM Using Vertical InGaAs Junction for Ultimate Cell Scalability JP Kim, J Sim, P Bidenko, DM Geum, SK Kim, J Shim, J Kim, S Kim IEEE Electron Device Letters 43 (11), 1834-1837, 2022 | 1 | 2022 |
| Influence of Channel Structure on the Subthreshold Swing of InGaAs HEMTs at Cryogenic Temperatures Down to 4 K J Jeong, J Kim, J Lee, YJ Suh, N Rheem, SK Kim, J Park, BH Kim, JP Kim, ... IEEE Transactions on Electron Devices, 2024 | | 2024 |
| Large Polarization of Hf0.5Zr0.5Ox Ferroelectric Film on InGaAs with Electric-Field Cycling and Annealing Temperature Engineering YJ Suh, J Jeong, BH Kim, SH Kuk, SK Kim, JP Kim, S Kim IEEE Electron Device Letters, 2024 | | 2024 |
| BEOL-compatible 4F2 Single Crystalline Semiconductor Oscillator for Low-power and Large-scale Oscillatory Neural Network Hardware JP Kim, HW Kim, J Jeong, J Park, SK Kim, J Kim, J Woo, S Kim 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |
| Impact of the channel thickness fluctuation on the subthreshold swing of InGaAs HEMTs at cryogenic temperature down to4K for ultra-low power LNAs J Jeong, J Kim, J Lee, YJ Suh, N Rheem, SK Kim, J Park, BH Kim, JP Kim, ... 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |
| Thermal Management in Multi-Finger GaN-on-Si HEMTs: Understanding and Mitigating Self-Heating and Thermal Crosstalk for Enhanced Device Reliability J Jeong, SJ Choi, J Shim, E Kim, SK Kim, BH Kim, JP Kim, YJ Suh, ... 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |
| Role of Inter-Layer Dielectric on the Electrical and Heat Dissipation Characteristics in the Heterogeneous 3D Sequential CFETs with Ge p-FETs on Si n-FETs SK Kim, HR Lim, J Shim, W Baek, S Kim, Y Park, J Jeong, J Lim, JP Kim, ... 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |
