| Development flow for on-line core self-test of automotive microcontrollers P Bernardi, R Cantoro, S De Luca, E Sánchez, A Sansonetti IEEE Transactions on Computers 65 (3), 744-754, 2015 | 41 | 2015 |
| A suite of IEEE 1687 benchmark networks A Tšertov, A Jutman, S Devadze, MS Reorda, E Larsson, FG Zadegan, ... 2016 IEEE International Test Conference (ITC), 1-10, 2016 | 33 | 2016 |
| A flexible framework for the automatic generation of SBST programs A Riefert, R Cantoro, M Sauer, MS Reorda, B Becker IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (10 …, 2016 | 33 | 2016 |
| On the testability of IEEE 1687 networks R Cantoro, M Montazeri, MS Reorda, FG Zadegan, E Larsson 2015 IEEE 24th Asian Test Symposium (ATS), 211-216, 2015 | 26 | 2015 |
| On the automatic generation of SBST test programs for in-field test A Riefert, R Cantoro, M Sauer, MS Reorda, B Becker 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015 | 24 | 2015 |
| On the in-field functional testing of decode units in pipelined RISC processors P Bernardi, R Cantoro, L Ciganda, E Sánchez, MS Reorda, S De Luca, ... 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2014 | 23 | 2014 |
| On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors P Bernardi, R Cantoro, L Ciganda, B Du, E Sánchez, MS Reorda, ... 2013 14th International Workshop on Microprocessor Test and Verification, 52-57, 2013 | 17 | 2013 |
| Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks R Cantoro, M Montazeri, M Sonza, FG Zadegan, E Larsson 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System …, 2016 | 13 | 2016 |
| About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications R Cantoro, A Firrincieli, D Piumatti, M Restifo, E Sánchez, MS Reorda 2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018 | 12 | 2018 |
| Software-based self-test techniques of computational modules in dual issue embedded processors P Bernardi, C Bovi, R Cantoro, S De Luca, R Meregalli, D Piumatti, ... 2015 20th IEEE European Test Symposium (ETS), 1-2, 2015 | 12 | 2015 |
| Test time minimization in reconfigurable scan networks R Cantoro, M Palena, P Pasini, MS Reorda 2016 IEEE 25th Asian Test Symposium (ATS), 119-124, 2016 | 10 | 2016 |
| On the functional test of the cache coherency logic in multi-core systems JP Acle, R Cantoro, E Sánchez, MS Reorda 2015 IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2015 | 10 | 2015 |
| An analysis of test solutions for COTS-based systems in space applications R Cantoro, S Carbonara, A Floridia, E Sánchez, MS Reorda, JG Mess 2018 IFIP/IEEE International Conference on Very Large Scale Integration …, 2018 | 9 | 2018 |
| Test of reconfigurable modules in scan networks R Cantoro, FG Zadegan, M Palena, P Pasini, E Larsson, MS Reorda IEEE Transactions on Computers 67 (12), 1806-1817, 2018 | 8 | 2018 |
| An evolutionary technique for reducing the duration of reconfigurable scan network test R Cantoro, L San Paolo, MS Reorda, G Squillero 2018 IEEE 21st International Symposium on Design and Diagnostics of …, 2018 | 7 | 2018 |
| Software-based self-test techniques for dual-issue embedded processors P Bernardi, R Cantoro, S De Luca, E Sanchez, A Sansonetti, G Squillero IEEE Transactions on Emerging Topics in Computing 8 (2), 464-477, 2017 | 7 | 2017 |
| In-field functional test programs development flow for embedded FPUs R Cantoro, D Piumatti, P Bernardi, S De Luca, A Sansonetti 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2016 | 7 | 2016 |
| A new technique to generate test sequences for reconfigurable scan networks R Cantoro, A Damljanovic, MS Reorda, G Squillero 2018 IEEE International Test Conference (ITC), 1-9, 2018 | 6 | 2018 |
| A DMA and CACHE-based stress schema for burn-in of automotive microcontroller P Bernardi, R Cantoro, L Gianotto, M Restifo, E Sánchez, F Venini, ... 2017 18th IEEE Latin American Test Symposium (LATS), 1-6, 2017 | 6 | 2017 |
| Effective generation and evaluation of diagnostic SBST programs A Riefert, R Cantoro, M Sauer, MS Reorda, B Becker 2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016 | 6 | 2016 |
