A 0.8 THz SiGe HBT Operating at 4.3 K PS Chakraborty, AS Cardoso, BR Wier, AP Omprakash, JD Cressler, ...
IEEE Electron Device Letters 35 (2), 151-153, 2014
88 2014 Operation of SiGe HBTs down to 70 mK H Ying, BR Wier, J Dark, NE Lourenco, L Ge, AP Omprakash, M Mourigal, ...
IEEE Electron Device Letters 38 (1), 12-15, 2016
36 2016 Collector transport in SiGe HBTs operating at cryogenic temperatures H Ying, J Dark, AP Omprakash, BR Wier, L Ge, U Raghunathan, ...
IEEE Transactions on Electron Devices 65 (9), 3697-3703, 2018
26 2018 Single-event transient and total dose response of precision voltage reference circuits designed in a 90-nm SiGe BiCMOS technology AS Cardoso, PS Chakraborty, N Karaulac, DM Fleischhauer, ...
IEEE transactions on Nuclear Science 61 (6), 3210-3217, 2014
26 2014 Tunneling, current gain, and transconductance in silicon-germanium heterojunction bipolar transistors operating at millikelvin temperatures D Davidović, H Ying, J Dark, BR Wier, L Ge, NE Lourenco, AP Omprakash, ...
Physical Review Applied 8 (2), 024015, 2017
23 2017 Comparison of single-event transients in SiGe HBTs on bulk and thick-film SOI A Ildefonso, GN Tzintzarov, D Nergui, AP Omprakash, PS Goley, ...
IEEE Transactions on Nuclear Science 67 (1), 71-80, 2019
18 2019 Hot-carrier-damage-induced current gain enhancement (CGE) effects in SiGe HBTs US Raghunathan, RP Martinez, BR Wier, AP Omprakash, H Ying, ...
IEEE Transactions on Electron Devices 65 (6), 2430-2438, 2018
13 2018 Single-event transients in SiGe HBTs induced by pulsed X-ray microbeam D Nergui, A Ildefonso, GN Tzintzarov, NE Lourenco, AP Omprakash, ...
IEEE Transactions on Nuclear Science 67 (1), 91-98, 2019
12 2019 Physical differences in hot carrier degradation of oxide interfaces in complementary (np-n+ pnp) SiGe HBTs US Raghunathan, H Ying, BR Wier, AP Omprakash, PS Chakraborty, ...
IEEE Transactions on Electron Devices 64 (1), 37-44, 2016
11 2016 An investigation of high-temperature (to 300° C) safe-operating-area in a high-voltage complementary SiGe on SOI technology AP Omprakash, H Dao, US Raghunathan, H Ying, PS Chakraborty, ...
IEEE Transactions on Electron Devices 64 (9), 3748-3755, 2017
9 2017 On the cryogenic RF linearity of SiGe HBTs in a fourth-generation 90-nm SiGe BiCMOS technology AS Cardoso, AP Omprakash, PS Chakraborty, N Karaulac, ...
IEEE Transactions on Electron Devices 62 (4), 1127-1135, 2015
9 2015 A broadband logarithmic power detector using 130 nm SiGe BiCMOS technology Y Gong, S Lee, H Ying, AP Omprakash, E Gebara, H Gu, C Nicholls, ...
2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and …, 2019
7 2019 Investigation of f T -Doubler Technique to Improve RF Performance of Inverse-Mode SiGe HBTs MAR Sarker, AP Omprakash, MK Cho, JD Cressler, I Song
IEEE Microwave and Wireless Components Letters 30 (9), 873-875, 2020
6 2020 DC and RF variability of SiGe HBTs operating down to deep cryogenic temperatures H Ying, JW Teng, GN Tzintzarov, AP Omprakash, SG Rao, ...
2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and …, 2019
6 2019 Total ionizing dose effects on a high-voltage (> 30V) complementary SiGe on SOI technology AP Omprakash, ZE Fleetwood, US Raghunathan, A Ildefonso, ...
IEEE Transactions on Nuclear Science 64 (1), 277-284, 2016
6 2016 On the potential of using SiGe HBTs on SOI to support emerging applications up to 300° C AP Omprakash, PS Chakraborty, H Ying, AS Cardoso, A Ildefonso, ...
2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting-BCTM, 27-30, 2015
6 2015 The effects of temperature on the single-event transient response of a high-voltage (> 30 V) complementary SiGe-on-SOI technology AP Omprakash, A Ildefonso, ZE Fleetwood, GN Tzintzarov, AS Cardoso, ...
IEEE Transactions on Nuclear Science 66 (1), 389-396, 2018
4 2018 Modeling of high-current damage in SiGe HBTs under pulsed stress US Raghunathan, B Wier, RP Martinez, ZE Fleetwood, A Omprakash, ...
2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 17-20, 2016
4 2016 On the cryogenic performance of ultra-low-loss, wideband SPDT RF switches designed in a 180 nm SOI-CMOS technology AS Cardoso, PS Chakraborty, AP Omprakash, N Karaulac, P Saha, ...
2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S …, 2014
3 2014 Using SiGe-on-SOI HBTs to Build 300° C Capable Analog Circuits AP Omprakash, A Ildefonso, G Tzintzarov, J Babcock, R Mukhopadhyay, ...
2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2018
1 2018