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Mike Papadakis
Mike Papadakis
Associate professor, University of Luxembourg
Bestätigte E-Mail-Adresse bei uni.lu - Startseite
Titel
Zitiert von
Zitiert von
Jahr
Mutation testing advances: an analysis and survey
M Papadakis, M Kintis, J Zhang, Y Jia, Y Le Traon, M Harman
Advances in Computers 112, 275-378, 2019
4922019
Static analysis of android apps: A systematic literature review
L Li, TF Bissyandé, M Papadakis, S Rasthofer, A Bartel, D Octeau, J Klein, ...
Information and Software Technology 88, 67-95, 2017
4022017
Metallaxis‐FL: mutation‐based fault localization
M Papadakis, Y Le Traon
Software Testing, Verification and Reliability 25 (5-7), 605-628, 2015
3272015
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon
IEEE Transactions on Software Engineering, 1-1, 2014
276*2014
Pit: a practical mutation testing tool for java
H Coles, T Laurent, C Henard, M Papadakis, A Ventresque
Proceedings of the 25th international symposium on software testing and …, 2016
2662016
Trivial compiler equivalence: A large scale empirical study of a simple, fast and effective equivalent mutant detection technique
M Papadakis, Y Jia, M Harman, Y Le Traon
2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015
2372015
Comparing White-box and Black-box Test Prioritization
C Henard, M Papadakis, M Harman, Y Jia, Y Le Traon
ICSE, 2016
2242016
Combining Multi-Objective Search and Constraint Solving for Configuring Large Software Product Lines
C Henard, M Papadakis, M Harman, Y Le Traon
37th International Conference on Software Engineering (ICSE), 2015
2242015
An empirical study on mutation, statement and branch coverage fault revelation that avoids the unreliable clean program assumption
TT Chekam, M Papadakis, Y Le Traon, M Harman
2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE …, 2017
1692017
Automatic mutation test case generation via dynamic symbolic execution
M Papadakis, N Malevris
2010 IEEE 21st International Symposium on Software Reliability Engineering …, 2010
1652010
Semantic fuzzing with zest
R Padhye, C Lemieux, K Sen, M Papadakis, Y Le Traon
Proceedings of the 28th ACM SIGSOFT International Symposium on Software …, 2019
1592019
An empirical evaluation of the first and second order mutation testing strategies
M Papadakis, N Malevris
2010 Third International Conference on Software Testing, Verification, and …, 2010
1532010
A replicable comparison study of NER software: StanfordNLP, NLTK, OpenNLP, SpaCy, Gate
X Schmitt, S Kubler, J Robert, M Papadakis, Y LeTraon
2019 Sixth International Conference on Social Networks Analysis, Management …, 2019
1522019
Multi-objective test generation for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, YL Traon
Proceedings of the 17th International Software Product Line Conference, 62-71, 2013
1502013
Threats to the validity of mutation-based test assessment
M Papadakis, C Henard, M Harman, Y Jia, Y Le Traon
Proceedings of the 25th International Symposium on Software Testing and …, 2016
1442016
Are mutation scores correlated with real fault detection? a large scale empirical study on the relationship between mutants and real faults
M Papadakis, D Shin, S Yoo, DH Bae
Proceedings of the 40th International Conference on Software Engineering …, 2018
1322018
Evaluating mutation testing alternatives: A collateral experiment
M Kintis, M Papadakis, N Malevris
2010 Asia Pacific Software Engineering Conference, 300-309, 2010
1312010
Using mutants to locate" unknown" faults
M Papadakis, Y Le Traon
2012 IEEE Fifth International Conference on Software Testing, Verification …, 2012
1232012
How effective are mutation testing tools? An empirical analysis of Java mutation testing tools with manual analysis and real faults
M Kintis, M Papadakis, A Papadopoulos, E Valvis, N Malevris, Y Le Traon
Empirical Software Engineering 23 (4), 2426-2463, 2018
106*2018
Assessing Software Product Line Testing via Model-based Mutation: An Application to Similarity Testing
C Henard, M Papadakis, G Perrouin, J Klein, Y Le Traon
992013
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