| Model-based and data-driven prognosis of automotive and electronic systems C Sankavaram, B Pattipati, A Kodali, K Pattipati, M Azam, S Kumar, ... Automation Science and Engineering, 2009. CASE 2009. IEEE International …, 2009 | 122 | 2009 |
| Approach to fault identification for electronic products using Mahalanobis distance S Kumar, TWS Chow, M Pecht IEEE Transactions on Instrumentation and Measurement 59 (8), 2055-2064, 2010 | 113 | 2010 |
| Parameter selection for health monitoring of electronic products S Kumar, E Dolev, M Pecht Microelectronics Reliability 50 (2), 161-168, 2010 | 78 | 2010 |
| A hybrid prognostics methodology for electronic products S Kumar, M Torres, YC Chan, M Pecht Neural Networks, 2008. IJCNN 2008.(IEEE World Congress on Computational …, 2008 | 73 | 2008 |
| Modeling approaches for prognostics and health management of electronics S Kumar, M Pecht International Journal of Performability Engineering 6 (5), 467-476, 2010 | 63 | 2010 |
| A health indicator method for degradation detection of electronic products S Kumar, NM Vichare, E Dolev, M Pecht Microelectronics Reliability 52 (2), 439-445, 2012 | 40 | 2012 |
| Health assessment of electronic products using Mahalanobis distance and projection pursuit analysis S Kumar, V Sotiris, M Pecht International Journal of Computer, Information, and Systems Science, and …, 2008 | 27 | 2008 |
| Mahalanobis distance and projection pursuit analysis for health assessment of electronic systems S Kumar, V Sotiris, M Pecht Aerospace Conference, 2008 IEEE, 1-9, 2008 | 27 | 2008 |
| Health monitoring of electronic products using symbolic time series analysis S Kumar, M Pecht AAAI fall symposium on artificial intelligence for prognostics, 73-80, 2007 | 27 | 2007 |
| Data analysis approach for system reliability, diagnostics and prognostics M Pecht, S Kumar Pan pacific microelectronics symposium, Kauai, Hawaii, USA, 22-24, 2008 | 26 | 2008 |
| Baseline performance of notebook computers under various environmental and usage conditions for prognostics S Kumar, M Pecht IEEE Transactions on Components and Packaging Technologies 32 (3), 667-676, 2009 | 13 | 2009 |
| A residual estimation based approach for isolating faulty parameters S Kumar, E Dolev, M Pecht, M Pompetzki Aerospace conference, 2009 IEEE, 1-8, 2009 | 4 | 2009 |
| Anomaly Detection in Electronic Products AT Michael, S Kumar, S Mathew, M Pecht Electronics System-Integration Technology Conference, 2008 | 3 | 2008 |
