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Sebastian Huhn
Sebastian Huhn
Bestätigte E-Mail-Adresse bei informatik.uni-bremen.de
Titel
Zitiert von
Zitiert von
Jahr
Exploring superior structural materials using multi-objective optimization and formal techniques
R Drechsler, S Eggersgluß, N Ellendt, S Huhn, L Madler
2016 Sixth International Symposium on Embedded Computing and System Design …, 2016
182016
Optimization of retargeting for IEEE 1149.1 TAP controllers with embedded compression
S Huhn, S Eggersglüß, K Chakrabarty, R Drechsler
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017
142017
Determining application-specific knowledge for improving robustness of sequential circuits
S Huhn, S Frehse, R Wille, R Drechsler
IEEE Transactions on very large scale integration (VLSI) systems 27 (4), 875-887, 2019
112019
SAT-Lancer: a hardware SAT-solver for self-verification
B Ustaoglu, S Huhn, D Große, R Drechsler
Proceedings of the 2018 on Great Lakes Symposium on VLSI, 479-482, 2018
112018
Power-aware test scheduling for IEEE 1687 networks with multiple power domains
P Habiby, S Huhn, R Drechsler
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020
102020
Hybrid architecture for embedded test compression to process rejected test patterns
S Huhn, D Tille, R Drechsler
2019 IEEE European Test Symposium (ETS), 1-2, 2019
102019
Revealing properties of structural materials by combining regression-based algorithms and nano indentation measurements
S Huhn, H Sonnenberg, S Eggersglüß, B Clausen, R Drechsler
2017 IEEE Symposium Series on Computational Intelligence (SSCI), 1-6, 2017
102017
VecTHOR: Low-cost compression architecture for IEEE 1149-compliant TAP controllers
S Huhn, S Eggersglüß, R Drechsler
2016 21th IEEE European Test Symposium (ETS), 1-6, 2016
102016
Optimization-based test scheduling for IEEE 1687 multi-power domain networks using Boolean satisfiability
P Habiby, S Huhn, R Drechsler
2021 16th International Conference on Design & Technology of Integrated …, 2021
92021
Reconfigurable TAP controllers with embedded compression for large test data volume
S Huhn, S Eggersglüß, R Drechsler
2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2017
72017
Enhancing robustness of sequential circuits using application-specific knowledge and formal methods
S Huhn, S Frehse, R Wille, R Drechsler
2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC), 182-187, 2017
62017
Power-aware test scheduling framework for IEEE 1687 multi-power domain networks using formal techniques
P Habiby, S Huhn, R Drechsler
Microelectronics Reliability 134, 114551, 2022
42022
Quality assessment of RFET-based logic locking protection mechanisms using formal methods
M Merten, S Huhn, R Drechsler
2022 IEEE European Test Symposium (ETS), 1-2, 2022
42022
Combining machine learning and formal techniques for small data applications-A framework to explore new structural materials
R Drechsler, S Huhn, C Plump
2020 23rd Euromicro Conference on Digital System Design (DSD), 518-525, 2020
42020
A hybrid embedded multichannel test compression architecture for low-pin count test environments in safety-critical systems
S Huhn, D Tille, R Drechsler
2019 IEEE International Test Conference in Asia (ITC-Asia), 115-120, 2019
42019
SAT-Hard: A learning-based hardware SAT-solver
B Ustaoglu, S Huhn, FS Torres, D Große, R Drechsler
2019 22nd Euromicro Conference on Digital System Design (DSD), 74-81, 2019
42019
A Codeword-Based Compaction Technique for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Ntworks
S Huhn, M Merten, S Eggersglüß, R Drechsler
Informal Proceedings of the GI/GMM/ITG Workshop für Testmethoden und …, 2018
42018
Design enablement flow for circuits with inherent obfuscation based on reconfigurable transistors
J Trommer, N Bhattacharjee, T Mikolajick, S Huhn, M Merten, ...
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023
32023
Enhanced Embedded Test Compression Technique For Processing Incompressible Test Patterns
S Huhn, S Eggersglüß, R Drechsler
Informal Proceedings of the GI/GMM/ITG Workshop für Testmethoden und …, 2019
32019
Leichtgewichtige Datenkompressions-Architektur für IEEE-1149.1-kompatible Testschnittstellen
S Huhn, S Eggersglüß, R Drechsler
Informal Proceedings of the GI/GMM/ITG Workshop für Testmethoden und …, 2016
32016
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