Impact of deposition and annealing temperature on material and electrical characteristics of ALD HfO2 D Triyoso, R Liu, D Roan, M Ramon, NV Edwards, R Gregory, D Werho, ...
Journal of the Electrochemical Society 151 (10), F220, 2004
140 2004 CMOS-compatible synthesis of large-area, high-mobility graphene by chemical vapor deposition of acetylene on cobalt thin films ME Ramon, A Gupta, C Corbet, DA Ferrer, HCP Movva, G Carpenter, ...
Acs Nano 5 (9), 7198-7204, 2011
120 2011 Film properties of ALD and gate dielectrics grown on Si with various pre-deposition treatments DH Triyoso, RI Hegde, J Grant, P Fejes, R Liu, D Roan, M Ramon, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2004
96 2004 Impact of titanium addition on film characteristics of gate dielectrics deposited by atomic layer deposition DH Triyoso, RI Hegde, S Zollner, ME Ramon, S Kalpat, R Gregory, ...
Journal of applied physics 98 (5), 054104, 2005
87 2005 Impact of titanium addition on film characteristics of gate dielectrics deposited by atomic layer deposition DH Triyoso, RI Hegde, S Zollner, ME Ramon, S Kalpat, R Gregory, ...
Journal of applied physics 98 (5), 054104, 2005
87 2005 Three-gigahertz graphene frequency doubler on quartz operating beyond the transit frequency ME Ramón, KN Parrish, SF Chowdhury, CW Magnuson, HCP Movva, ...
IEEE Transactions on Nanotechnology 11 (5), 877-883, 2012
61 2012 HfO2 gate dielectrics deposited via tetrakis diethylamido hafnium J Schaeffer, NV Edwards, R Liu, D Roan, B Hradsky, R Gregory, J Kulik, ...
Journal of the Electrochemical Society 150 (4), F67, 2003
60 2003 Defect Passivation With Fluorine and Interface Engineering for Hf-Based High- /Metal Gate Stack Device Reliability and Performance Enhancement HH Tseng, PJ Tobin, S Kalpat, JK Schaeffer, ME Ramon, LRC Fonseca, ...
IEEE transactions on electron devices 54 (12), 3267-3275, 2007
58 2007 Physical and electrical characteristics of HfO2 gate dielectrics deposited by ALD and MOCVD DH Triyoso, M Ramon, RI Hegde, D Roan, R Garcia, J Baker, XD Wang, ...
Journal of the Electrochemical Society 152 (3), G203, 2005
51 2005 Improved short channel device characteristics with stress relieved pre-oxide (SRPO) and a novel tantalum carbon alloy metal gate/HfO/sub 2/stack HH Tseng, CC Capasso, JK Schaeffer, EA Hebert, PJ Tobin, DC Gilmer, ...
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 …, 2004
42 2004 Characteristics of mixed oxides and nanolaminates of atomic layer deposited HfO2–TiO2 gate dielectrics DH Triyoso, RI Hegde, XD Wang, MW Stoker, R Rai, ME Ramon, ...
Journal of The Electrochemical Society 153 (9), G834, 2006
39 2006 Characteristics of mixed oxides and nanolaminates of atomic layer deposited HfO2–TiO2 gate dielectrics DH Triyoso, RI Hegde, XD Wang, MW Stoker, R Rai, ME Ramon, ...
Journal of The Electrochemical Society 153 (9), G834, 2006
39 2006 Self-aligned inversion-type enhancement-mode GaAs metal-oxide-semiconductor field-effect transistor with gate dielectric D Shahrjerdi, T Akyol, M Ramon, DI Garcia-Gutierrez, E Tutuc, ...
Applied Physics Letters 92 (20), 203505, 2008
36 2008 BTI characteristics and mechanisms of metal gated HfO/sub 2/films with enhanced interface/bulk process treatments S Kalpat, HH Tseng, M Ramon, M Moosa, D Tekleab, PJ Tobin, ...
IEEE Transactions on Device and Materials Reliability 5 (1), 26-35, 2005
34 2005 Self-aligned graphene field-effect transistors with polyethyleneimine doped source/drain access regions HCP Movva, ME Ramón, CM Corbet, S Sonde, S Fahad Chowdhury, ...
Applied Physics Letters 101 (18), 183113, 2012
30 2012 Microstructure modified HfO/sub 2/using Zr addition with Ta/sub x/C/sub y/gate for improved device performance and reliability RI Hegde, DH Triyoso, PJ Tobin, S Kalpat, ME Ramon, HH Tseng, ...
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest., 35-38, 2005
27 2005 A compact model for graphene FETs for linear and non-linear circuits KN Parrish, ME Ramón, SK Banerjee, D Akinwande
Proc. SISPAD, 75-78, 2012
26 2012 Hall mobility measurements in enhancement-mode GaAs field-effect transistors with gate dielectric D Shahrjerdi, J Nah, B Hekmatshoar, T Akyol, M Ramon, E Tutuc, ...
Applied Physics Letters 97 (21), 213506, 2010
24 2010 Uniaxial-biaxial stress hybridization for super-critical strained-si directly on insulator (SC-SSOI) PMOS with different channel orientations. AVY Thean, L Prabhu, V Vartanian, M Ramon, BY Nguyen, T White, ...
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest …, 2005
24 2005 Performance of super-critical strained-Si directly on insulator (SC-SSOI) CMOS based on high-performance PD-SOI technology AVY Thean, T White, M Sadaka, L McCormick, M Ramon, R Mora, ...
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005., 134-135, 2005
24 2005