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Yves Le Traon
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Flowdroid: Precise context, flow, field, object-sensitive and lifecycle-aware taint analysis for android apps
S Arzt, S Rasthofer, C Fritz, E Bodden, A Bartel, J Klein, Y Le Traon, ...
Acm Sigplan Notices 49 (6), 259-269, 2014
25172014
Androzoo: Collecting millions of android apps for the research community
K Allix, TF Bissyandé, J Klein, Y Le Traon
Proceedings of the 13th international conference on mining software …, 2016
8772016
Iccta: Detecting inter-component privacy leaks in android apps
L Li, A Bartel, TF Bissyandé, J Klein, Y Le Traon, S Arzt, S Rasthofer, ...
2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015
7492015
Effective {Inter-Component} communication mapping in android: An essential step towards holistic security analysis
D Octeau, P McDaniel, S Jha, A Bartel, E Bodden, J Klein, Y Le Traon
22nd USENIX Security Symposium (USENIX Security 13), 543-558, 2013
5672013
A state-of the-art survey & testbed of fuzzy AHP (FAHP) applications
S Kubler, J Robert, W Derigent, A Voisin, Y Le Traon
Expert systems with applications 65, 398-422, 2016
4572016
Mutation testing advances: an analysis and survey
M Papadakis, M Kintis, J Zhang, Y Jia, Y Le Traon, M Harman
Advances in Computers 112, 275-378, 2019
4492019
Automatic test generation: A use case driven approach
C Nebut, F Fleurey, Y Le Traon, JM Jezequel
IEEE Transactions on Software Engineering 32 (3), 140-155, 2006
4252006
Refactoring UML models
G Sunyé, D Pollet, Y Le Traon, JM Jézéquel
International Conference on the Unified Modeling Language, 134-148, 2001
4222001
Static analysis of android apps: A systematic literature review
L Li, TF Bissyandé, M Papadakis, S Rasthofer, A Bartel, D Octeau, J Klein, ...
Information and Software Technology 88, 67-95, 2017
3842017
Dexpler: converting android dalvik bytecode to jimple for static analysis with soot
A Bartel, J Klein, Y Le Traon, M Monperrus
Proceedings of the ACM SIGPLAN International Workshop on State of the Art in …, 2012
3192012
Metallaxis‐FL: mutation‐based fault localization
M Papadakis, Y Le Traon
Software Testing, Verification and Reliability 25 (5-7), 605-628, 2015
3112015
Automated and scalable t-wise test case generation strategies for software product lines
G Perrouin, S Sen, J Klein, B Baudry, Y Le Traon
2010 Third international conference on software testing, verification and …, 2010
3062010
Improving test suites for efficient fault localization
B Baudry, F Fleurey, Y Le Traon
Proceedings of the 28th international conference on Software engineering, 82-91, 2006
2882006
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon
IEEE Transactions on Software Engineering 40 (7), 650-670, 2014
2362014
Trivial compiler equivalence: A large scale empirical study of a simple, fast and effective equivalent mutant detection technique
M Papadakis, Y Jia, M Harman, Y Le Traon
2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015
2272015
Combining multi-objective search and constraint solving for configuring large software product lines
C Henard, M Papadakis, M Harman, Y Le Traon
2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015
2202015
Comparing white-box and black-box test prioritization
C Henard, M Papadakis, M Harman, Y Jia, Y Le Traon
Proceedings of the 38th International Conference on Software Engineering …, 2016
2122016
Efficient object-oriented integration and regression testing
Y Le Traon, T Jéron, JM Jézéquel, P Morel
IEEE Transactions on Reliability 49 (1), 12-25, 2000
2032000
Automatically securing permission-based software by reducing the attack surface: An application to android
A Bartel, J Klein, Y Le Traon, M Monperrus
Proceedings of the 27th IEEE/ACM International Conference on Automated …, 2012
1982012
Metamodel-based test generation for model transformations: an algorithm and a tool
E Brottier, F Fleurey, J Steel, B Baudry, Y Le Traon
2006 17th International Symposium on Software Reliability Engineering, 85-94, 2006
1972006
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