| Data injection attack against electronic devices with locally weakened immunity using a hardware Trojan S Kaji, M Kinugawa, D Fujimoto, Y Hayashi IEEE Transactions on Electromagnetic Compatibility 61 (4), 1115-1121, 2018 | 15 | 2018 |
| Echo tempest: Em information leakage induced by iemi for electronic devices S Kaji, D Fujimoto, M Kinugawa, Y Hayashi IEEE Transactions on Electromagnetic Compatibility, 2023 | 6 | 2023 |
| Segmentation method based modeling and analysis of a glass package power distribution network (PDN) Y Kim, D Fujimoto, S Kaji, S Wada, H Park, D Lho, J Kim, Y Hayashi Nonlinear Theory and Its Applications, IEICE 11 (2), 170-188, 2020 | 5 | 2020 |
| A Fundamental Evaluation of EM Information Leakage Induced by IEMI for a Device with Differential Signaling S Kaji, D Fujimoto, Y Kim, Y Hayashi 2021 Asia-Pacific International Symposium on Electromagnetic Compatibility …, 2021 | 1 | 2021 |
| Method for Identifying Individual Electronic Devices Focusing on Differences in Spectrum Emissions S Kaji, M Kinugawa, D Fujimoto, L Sauvage, JL Danger, Y Hayashi 2019 Joint International Symposium on Electromagnetic Compatibility and Asia …, 2019 | 1 | 2019 |
| Simulation-Based Approach to Generating Golden Data for PCB-Level Hardware Trojan Detection Using Capacitive Sensor S Kaji, D Fujimoto, Y Hayashi 2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-7, 2023 | | 2023 |
| Enhanced Modulation Degree of Leakage Wave Induced by IEMI via Nonlinear Circuit Elements S Kaji, D Fujimoto, Y Hayashi 2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power …, 2023 | | 2023 |
| Fundamental Study on ID Generation Method Focusing on Distribution of Capacitance Sensor Output Values S Kaji, A Tachikake, D Fujimoto, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 122 (11), 19-23, 2022 | | 2022 |
| Fundamental Evaluation Method for EM Information Leakage Caused by Hardware Trojans on Signal Cables--Impact of Modulation Factor and Emission Intensity T Yukawa, S Kaji, D Fujimoto, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 121 (413), 153-157, 2022 | | 2022 |
| Development of an Evaluation System for Modeling of Information Leakage Induced by Low-Power IEMI S TAKANO, S KAJI, M KINUGAWA, D FUJIMOTO, Y HAYASHI 電子情報通信学会技術研究報告 (Web) 122 (206 (EMCJ2022 35-62)), 93-96, 2022 | | 2022 |
| Fundamental Study on Hardware Trojan Detection on Cable Using On-chip Sensor Y Nishitoba, S Kaji, M Kinugawa, D Fujimoto, Y Hayshi IEICE Technical Report; IEICE Tech. Rep. 121 (206), 38-42, 2021 | | 2021 |
| Fundamental Study on Individual Identification of Printed Circuit Boards Using Capacitance Sensors A Tachikake, S Kaji, D Fujitomo, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 121 (206), 49-52, 2021 | | 2021 |
| Fundamental Study on Effect of Surface Roughness of Contact Boundary and Torque Value on High-Frequency Characteristics of Connectors H Ueda, S Kaji, D Fujimoto, Y Kim, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 120 (425), 40-43, 2021 | | 2021 |
| Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation H Ueda, S Kaji, Y Kim, D Fujimoto, T Kitazawa, T Kasuga, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 120 (275), 34-38, 2020 | | 2020 |
| Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference--Impact of Impedance Change in Digital Output Circuits S Kaji, D Fujimoto, M Kinugawa, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 120 (211), 13-17, 2020 | | 2020 |
| Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference S Kaji, D Fujimoto, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 120 (83), 25-28, 2020 | | 2020 |
| Fundamental Study on an Estimation Method of Irradiate Frequencies to Forcibly Cause Electromagnetic Information Leakage S Kaji, M Kinugawa, D Fujimoto, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 119 (143), 235-238, 2019 | | 2019 |
| Fundamental Study on Suppression of Self-Interference Wave Caused by Intentional Information Leakage with IEMI R Kawakami, S Kaji, M Kinugawa, D Fujimoto, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 119 (2), 31-35, 2019 | | 2019 |
| Fundamental Study on Individual Identification Method of Electronic Device Using Difference of Radiation Spectrum Caused by Manufacturing/Mounting Variations S Kaji, D Fujimoto, L Sauvage, JL Danger, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 118 (458), 163-167, 2019 | | 2019 |
| Fundamental Study on Data Injection Attacks Using a Hardware Trojan against ICT Devices S Kaji, M Kinugawa, D Fujimoto, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 118 (162), 49-54, 2018 | | 2018 |
