Folgen
Pablo Saraza-Canflanca
Pablo Saraza-Canflanca
Interuniversity Microelectronics Centre (imec)
Bestätigte E-Mail-Adresse bei imse-cnm.csic.es
Titel
Zitiert von
Zitiert von
Jahr
Flexible setup for the measurement of CMOS time-dependent variability with array-based integrated circuits
J Diaz-Fortuny, P Saraza-Canflanca, R Castro-Lopez, E Roca, ...
IEEE Transactions on Instrumentation and Measurement 69 (3), 853-864, 2019
252019
A detailed study of the gate/drain voltage dependence of RTN in bulk pMOS transistors
P Saraza-Canflanca, J Martín-Martínez, R Castro-Lopez, E Roca, ...
Microelectronic Engineering 215, 111004, 2019
152019
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level
P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ...
Integration 72, 13-20, 2020
122020
Statistical characterization of time-dependent variability defects using the maximum current fluctuation
P Saraza-Canflanca, J Martín-Martínez, R Castro-Lopez, E Roca, ...
IEEE Transactions on Electron Devices 68 (8), 4039-4044, 2021
112021
Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation
P Saraza-Canflanca, H Carrasco-Lopez, A Santana-Andreo, P Brox, ...
Microelectronics Reliability 118, 114049, 2021
112021
A model parameter extraction methodology including time-dependent variability for circuit reliability simulation
J Diaz-Fortuny, P Saraza-Canflanca, A Toro-Frías, R Castro-López, ...
2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018
112018
A ring-oscillator-based degradation monitor concept with tamper detection capability
J Diaz-Fortuny, P Saraza-Canflanca, E Bury, M Vandemaele, B Kaczer, ...
2022 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2022
102022
Design considerations of an SRAM array for the statistical validation of time-dependent variability models
P Saraza-Canflanca, D Malagon, F Passos, A Toro, J Núñez, ...
2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018
82018
A new time efficient methodology for the massive characterization of RTN in CMOS devices
G Pedreira, J Martín-Martínez, J Diaz-Fortuny, P Saraza-Canflanca, ...
2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019
72019
New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors
P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ...
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 150-155, 2019
72019
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
J Diaz-Fortuny, P Saraza-Canflanca, R Rodriguez, J Martin-Martinez, ...
Solid-State Electronics 185, 108037, 2021
62021
A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs
A Santana-Andreo, P Saraza-Canflanca, H Carrasco-Lopez, P Brox, ...
Integration 85, 1-9, 2022
52022
TiDeVa: a toolbox for the automated and robust analysis of Time-Dependent Variability at transistor level
P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ...
2019 16th International Conference on Synthesis, Modeling, Analysis and …, 2019
52019
Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation
J Diaz-Fortuny, D Sangani, P Saraza-Canflanca, E Bury, R Degraeve, ...
2023 IEEE International Reliability Physics Symposium (IRPS), 1-9, 2023
42023
Towards complete recovery of circuit degradation by annealing with on-chip heaters
J Diaz-Fortuny, P Saraza-Canflanca, M Lofrano, E Bury, R Degraeve, ...
IEEE Electron Device Letters 44 (2), 201-204, 2022
42022
Simulating the impact of random telegraph noise on integrated circuits
P Saraza-Canflanca, E Camacho-Ruiz, R Castro-Lopez, E Roca, ...
SMACD/PRIME 2021; International Conference on SMACD and 16th Conference on …, 2021
42021
Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator
A Toro-Frías, P Saraza-Canflanca, F Passos, P Martín-Lloret, ...
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 78-83, 2019
42019
A smart SRAM-Cell array for the experimental study of variability phenomena in CMOS technologies
P Saraza-Canflanca, H Carrasco-Lopez, A Santana-Andreo, ...
2022 IEEE International Reliability Physics Symposium (IRPS), P3-1-P3-5, 2022
32022
Circuit reliability prediction: challenges and solutions for the device time-dependent variability characterization roadblock
M Nafria, J Diaz-Fortuny, P Saraza-Canflanca, J Martin-Martinez, E Roca, ...
2021 IEEE Latin America Electron Devices Conference (LAEDC), 1-4, 2021
32021
Automated massive RTN characterization using a transistor array chip
P Saraza, J Diaz-Fortuny, A Toro-Frías, R Castro-López, E Roca, ...
2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018
32018
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20