Zeynep Celik-Butler
Zeynep Celik-Butler
Distinguished University Professor of Electrical Engineering, University of Texas at Arlington
Bestätigte E-Mail-Adresse bei uta.edu - Startseite
Titel
Zitiert von
Zitiert von
Jahr
Spectral dependence of 1ƒγ noise on gate bias in n-MOSFETS
Z Celik-Butler, TY Hsiang
Solid-state electronics 30 (4), 419-423, 1987
1221987
Micromachined infrared bolometers on flexible polyimide substrates
SA Dayeh, DP Butler, Z Celik-Butler
Sensors and Actuators A: Physical 118 (1), 49-56, 2005
1192005
A semiconductor YBaCuO microbolometer for room temperature IR imaging
A Jahanzeb, CM Travers, Z Celik-Butler, DP Butler, SG Tan
IEEE transactions on electron devices 44 (10), 1795-1801, 1997
1171997
Low-frequency noise in submicrometer MOSFETs with HfO2, HfO2/Al2O3 and HfAlOx gate stacks
B Min, SP Devireddy, Z Çelik-Butler, F Wang, A Zlotnicka, HH Tseng, ...
IEEE Trans. Electron Devices 51 (10), 1679-1687, 2004
1062004
A method for locating the position of oxide traps responsible for random telegraph signals in submicron MOSFETs
Z Çelik-Butler, P Vasina, NV Amarasinghe
IEEE transactions on electron devices 47 (3), 646-648, 2000
942000
Self-supporting uncooled infrared microbolometers with low-thermal mass
M Almasri, DP Butler, Z Celik-Butler
Journal of microelectromechanical systems 10 (3), 469-476, 2001
912001
Investigation of semiconducting YBaCuO thin films: A new room temperature bolometer
PC Shan, Z Celik‐Butler, DP Butler, A Jahanzeb, CM Travers, W Kula, ...
Journal of applied physics 80 (12), 7118-7123, 1996
781996
Cardiopulmonary resuscitation sensor
Z Celik-Butler, JW Priest, CL Cason, ME Mancini, KG Morallee, H Fossan
US Patent 8,034,006, 2011
752011
Determination of Si-SiO/sub 2/interface trap density by 1/f noise measurements
Z Celik-Butler, TY Hsiang
IEEE transactions on electron devices 35 (10), 1651-1655, 1988
671988
Fabrication of semiconducting YBaCuO surface-micromachined bolometer arrays
CM Travers, A Jahanzeb, DP Butler, Z Celik-Butler
Journal of microelectromechanical systems 6 (3), 271-276, 1997
591997
Extraction of oxide trap properties using temperature dependence of random telegraph signals in submicron metal–oxide–semiconductor field-effect transistors
NV Amarasinghe, Z Çelik-Butler, A Keshavarz
Journal of Applied Physics 89 (10), 5526-5532, 2001
582001
Semiconducting YBaCuO thin films for uncooled infrared bolometers
PC Shan, Z Çelik‐Butler, DP Butler, A Jahanzeb
Journal of applied physics 78 (12), 7334-7339, 1995
551995
Low-frequency noise in deep-submicron metal–oxide–semiconductor field-effect transistors
Z Celik-Butler
IEE Proceedings-Circuits, Devices and Systems 149 (1), 23-31, 2002
482002
Low-frequency noise characteristics of HfSiON gate-dielectric metal-oxide-semiconductor-field-effect transistors
B Min, SP Devireddy, Z Celik-Butler, A Shanware, K Green, JJ Chambers, ...
Applied Physics Letters 86 (8), 082102, 2005
472005
Characterization of electromigration parameters in VLSI metallizations by 1/ƒ noise measurements
Z Celik-Butler, W Yang, HH Hoang, WR Hunter
Solid-state electronics 34 (2), 185-188, 1991
471991
Micromachined bolometers on polyimide
A Mahmood, DP Butler, Z Celik-Butler
Sensors and Actuators A: Physical 132 (2), 452-459, 2006
462006
Micromachined integrated pressure–thermal sensors on flexible substrates
V Shamanna, S Das, Z Celik-Butler, DP Butler, KL Lawrence
Journal of Micromechanics and Microengineering 16 (10), 1984, 2006
432006
Physics-based 1/f noise model for MOSFETs with nitrided high-κ gate dielectrics
TH Morshed, SP Devireddy, Z Çelik-Butler, A Shanware, K Green, ...
Solid-state electronics 52 (5), 711-724, 2008
422008
Complex random telegraph signals in 0.06 μm2 MDD n-MOSFETs
NV Amarasinghe, Z Çelik-Butler
Solid-State Electronics 44 (6), 1013-1019, 2000
412000
MgO sacrificial layer for micromachining uncooled Y-Ba-Cu-O IR microbolometers on Si/sub 3/N/sub 4/bridges
JE Gray, Z Celik-Butler, DP Butler
Journal of microelectromechanical systems 8 (2), 192-199, 1999
411999
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