Simulated annealing analysis of Rutherford backscattering data NP Barradas, C Jeynes, RP Webb
Applied Physics Letters 71 (2), 291-293, 1997
773 1997 Elemental thin film depth profiles by ion beam analysis using simulated annealing-a new tool C Jeynes, NP Barradas, PK Marriott, G Boudreault, M Jenkin, E Wendler, ...
Journal of physics D: applied physics 36 (7), R97, 2003
228 2003 Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study MP Seah, SJ Spencer, F Bensebaa, I Vickridge, H Danzebrink, M Krumrey, ...
Surface and Interface Analysis: An International Journal devoted to the …, 2004
197 2004 Advanced physics and algorithms in the IBA DataFurnace NP Barradas, C Jeynes
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2008
179 2008 “Total IBA”–Where are we? C Jeynes, MJ Bailey, NJ Bright, ME Christopher, GW Grime, BN Jones, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012
144 2012 Origins and effects of a surfactant excess near the surface of waterborne acrylic pressure-sensitive adhesives J Mallégol, JP Gorce, O Dupont, C Jeynes, PJ McDonald, JL Keddie
Langmuir 18 (11), 4478-4487, 2002
123 2002 Accurate determination of quantity of material in thin films by Rutherford backscattering spectrometry C Jeynes, NP Barradas, E Szilágyi
Analytical chemistry 84 (14), 6061-6069, 2012
122 2012 Distribution of surfactants near acrylic latex film surfaces: a comparison of conventional and reactive surfactants (surfmers) E Aramendia, J Mallégol, C Jeynes, MJ Barandiaran, JL Keddie, JM Asua
Langmuir 19 (8), 3212-3221, 2003
121 2003 Effect of Irradiation-Induced Disorder on the Conductivity and Critical Temperature of the Organic Superconductor JG Analytis, A Ardavan, SJ Blundell, RL Owen, EF Garman, C Jeynes, ...
Physical review letters 96 (17), 177002, 2006
109 2006 Patterned low temperature copper-rich deposits using inkjet printing GG Rozenberg, E Bresler, SP Speakman, C Jeynes, JHG Steinke
Applied physics letters 81 (27), 5249-5251, 2002
109 2002 The thermoluminescence response of doped SiO2 optical fibres subjected to photon and electron irradiations S Hashim, S Al-Ahbabi, DA Bradley, M Webb, C Jeynes, AT Ramli, ...
Applied Radiation and Isotopes 67 (3), 423-427, 2009
107 2009 The new Surrey ion beam analysis facility A Simon, C Jeynes, RP Webb, R Finnis, Z Tabatabaian, PJ Sellin, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004
107 2004 International Atomic Energy Agency intercomparison of ion beam analysis software NP Barradas, K Arstila, G Battistig, M Bianconi, N Dytlewski, C Jeynes, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007
106 2007 Thin film depth profiling by ion beam analysis C Jeynes, JL Colaux
Analyst 141 (21), 5944-5985, 2016
104 2016 Reduction of bacterial adhesion on ion-implanted stainless steel surfaces Q Zhao, Y Liu, C Wang, S Wang, N Peng, C Jeynes
Medical engineering & physics 30 (3), 341-349, 2008
86 2008 Summary of “IAEA intercomparison of IBA software” NP Barradas, K Arstila, G Battistig, M Bianconi, N Dytlewski, C Jeynes, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2008
83 2008 Accurate RBS measurements of the indium content of InGaAs thin films C Jeynes, ZH Jafri, RP Webb, AC Kimber, MJ Ashwin
Surface and Interface Analysis: An International Journal devoted to the …, 1997
78 1997 Amorphous-iron disilicide: A promising semiconductor M Milosavljević, G Shao, N Bibić, CN McKinty, C Jeynes, KP Homewood
Applied Physics Letters 79 (10), 1438-1440, 2001
66 2001 Unambiguous automatic evaluation of multiple ion beam analysis data with simulated annealing NP Barradas, C Jeynes, RP Webb, U Kreissig, R Grötzschel
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1999
66 1999 Influence of interfaces on the rates of crosslinking in poly (dimethyl siloxane) coatings TRE Simpson, Z Tabatabaian, C Jeynes, B Parbhoo, JL Keddie
Journal of Polymer Science Part A: Polymer Chemistry 42 (6), 1421-1431, 2004
64 2004