| A SMT-based diagnostic test generation method for combinational circuits S Prabhu, MS Hsiao, L Lingappan, V Gangaram 2012 IEEE 30th VLSI Test Symposium (VTS), 215-220, 2012 | 28 | 2012 |
| Information-theoretic and statistical methods of failure log selection for improved diagnosis S Tanwir, S Prabhu, M Hsiao, L Lingappan 2015 IEEE International Test Conference (ITC), 1-10, 2015 | 24 | 2015 |
| A novel SMT-based technique for LFSR reseeding S Prabhu, MS Hsiao, L Lingappan, V Gangaram 2012 25th International Conference on VLSI Design, 394-399, 2012 | 9 | 2012 |
| An Efficient 2-Phase Strategy to Achieve High Branch Coverage SP Prabhu Virginia Tech, 2012 | 6 | 2012 |
| An efficient 2-phase strategy to achieve high branch coverage S Prabhu, MS Hsiao, S Krishnamoorthy, L Lingappan, V Gangaram, ... 2011 Asian Test Symposium, 167-174, 2011 | 6 | 2011 |
| A diagnosis-friendly LBIST architecture with property checking S Prabhu, VV Acharya, S Bagri, MS Hsiao 2014 International Test Conference, 1-9, 2014 | 5 | 2014 |
| Techniques for Enhancing Test and Diagnosis of Digital Circuits SP Prabhu Virginia Tech, 2015 | 3 | 2015 |
| Test generation for circuits with embedded memories using SMT S Prabhu, MS Hsiao, L Lingappan, V Gangaram 2013 18th IEEE European Test Symposium (ETS), 1-1, 2013 | 3 | 2013 |
| Property-checking based LBIST for improved diagnosability S Prabhu, VV Acharya, S Bagri, MS Hsiao 2014 19th IEEE European Test Symposium (ETS), 1-2, 2014 | 2 | 2014 |
