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Siegfried Selberherr
Siegfried Selberherr
Institute for Microelectronics, TU Wien
Verified email at TUWien.ac.at - Homepage
Title
Cited by
Cited by
Year
Analysis and Simulation of Semiconductor Devices
S Selberherr
10.1007/978-3-7091-8752-4, 1984
40861984
The Monte Carlo Method for Semiconductor Device Simulation
C Jacoboni, P Lugli, S Selberherr (Editor)
10.1007/978-3-7091-6963-6, 2012
17732012
The Stationary Semiconductor Device Equations
PA Markowich, S Selberherr (Editor)
10.1007/978-3-7091-3678-2, 1986
8481986
MOSFET Models for VLSI Circuit Simulation: Theory and Practice
N Arora, S Selberherr (Editor)
10.1007/978-3-7091-9247-4, 2012
8172012
SIMON - A simulator for single-electron tunnel devices and circuits
C Wasshuber, H Kosina, S Selberherr
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1997
5291997
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon
P Pichler, S Selberherr (Editor)
10.1007/978-3-7091-0597-9, 2012
4382012
MINIMOS - A two-dimensional MOS transistor analyzer
S Selberherr, A Schütz, HW Pötzl
IEEE Journal of Solid-State Circuits 15 (4), 605-615, 1980
4101980
Computational Single-Electronics
C Wasshuber, S Selberherr (Editor)
10.1007/978-3-7091-6257-6, 2001
3932001
Compact Transistor Modelling for Circuit Design
HC De Graaff, FM Klaassen, S Selberherr (Editor)
10.1007/978-3-7091-9043-2, 2012
3642012
A review of hydrodynamic and energy-transport models for semiconductor device simulation
T Grasser, TW Tang, H Kosina, S Selberherr
Proceedings of the IEEE 91 (2), 251-274, 2003
3572003
Analysis and Simulation of Heterostructure Devices
V Palankovski, R Quay, S Selberherr (Editor)
10.1007/978-3-7091-0560-3, 2004
2692004
Hans Goebl: Dialektometrische Studien. Band 2
H Goebl, S Selberherr, WD Rase, H Pudlatz
10.1515/9783110610758 192, viii+379, 2018
2642018
Hierarchical Device Simulation: The Monte-Carlo Perspective
C Jungemann, B Meinerzhagen, S Selberherr (Editor)
10.1007/978-3-7091-6086-2, 2003
2482003
MOS device modeling at 77 K
S Selberherr
IEEE Transactions on Electron Devices 36 (8), 1464-1474, 1989
2371989
The effect of general strain on the band structure and electron mobility of silicon
E Ungersboeck, S Dhar, G Karlowatz, VA Sverdlov, H Kosina, ...
IEEE Transactions on Electron Devices 54 (9), 2183-2190, 2007
2342007
The Drift Diffusion Equation and Its Applications in MOSFET Modeling
W Hänsch, S Selberherr (Editor)
10.1007/978-3-7091-9095-1, 2012
2042012
A CMOS IC for portable EEG acquisition systems
R Martins, S Selberherr, FA Vaz
IEEE Transactions on Instrumentation and Measurement 47 (5), 1191-1196, 1998
2021998
Semiconductor Device Modelling
R Baets, J Barker, JA Barnard, TM Barton, ME Clarke, A Cappy, ...
10.1007/978-1-4471-1033-0, 2012
1982012
Modelling of Interface Carrier Transport for Device Simulation
D Schroeder, S Selberherr (Editor)
10.1007/978-3-7091-6644-4, 1994
1981994
Unified particle approach to Wigner-Boltzmann transport in small semiconductor devices
M Nedjalkov, H Kosina, S Selberherr, CA Ringhofer, DK Ferry
Physical Review B 70 (115319), 1-16, 2004
1862004
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