alois lugstein
alois lugstein
Professor at TU Wien
Verified email at
Cited by
Cited by
Integrating an ultramicroelectrode in an AFM cantilever: combined technology for enhanced information
C Kranz, G Friedbacher, B Mizaikoff, A Lugstein, J Smoliner, E Bertagnolli
Analytical chemistry 73 (11), 2491-2500, 2001
Deep-ultraviolet solar-blind photoconductivity of individual gallium oxide nanobelts
L Li, E Auer, M Liao, X Fang, T Zhai, UK Gautam, A Lugstein, Y Koide, ...
Nanoscale 3 (3), 1120-1126, 2011
Integrated AFM–SECM in tapping mode: simultaneous topographical and electrochemical imaging of enzyme activity
A Kueng, C Kranz, A Lugstein, E Bertagnolli, B Mizaikoff
Angewandte Chemie International Edition 42 (28), 3238-3240, 2003
Tuning the electro-optical properties of germanium nanowires by tensile strain
J Greil, A Lugstein, C Zeiner, G Strasser, E Bertagnolli
Nano letters 12 (12), 6230-6234, 2012
Pressure-induced orientation control of the growth of epitaxial silicon nanowires
A Lugstein, M Steinmair, YJ Hyun, G Hauer, P Pongratz, E Bertagnolli
Nano letters 8 (8), 2310-2314, 2008
Anomalous piezoresistance effect in ultrastrained silicon nanowires
A Lugstein, M Steinmair, A Steiger, H Kosina, E Bertagnolli
Nano letters 10 (8), 3204-3208, 2010
Mapping of enzyme activity by detection of enzymatic products during AFM imaging with integrated SECM–AFM probes
C Kranz, A Kueng, A Lugstein, E Bertagnolli, B Mizaikoff
Ultramicroscopy 100 (3-4), 127-134, 2004
Full three-dimensional simulation of focused ion beam micro/nanofabrication
HB Kim, G Hobler, A Steiger, A Lugstein, E Bertagnolli
Nanotechnology 18 (24), 245303, 2007
AFM‐Tip‐Integrated Amperometric Microbiosensors: High‐Resolution Imaging of Membrane Transport
A Kueng, C Kranz, A Lugstein, E Bertagnolli, B Mizaikoff
Angewandte Chemie 117 (22), 3485-3488, 2005
FIB processing of silicon in the nanoscale regime
A Lugstein, B Basnar, J Smoliner, E Bertagnolli
Applied Physics A 76 (4), 545-548, 2003
Combined scanning electrochemical atomic force microscopy for tapping mode imaging
A Kueng, C Kranz, B Mizaikoff, A Lugstein, E Bertagnolli
Applied Physics Letters 82 (10), 1592-1594, 2003
Hydroisomerization and cracking of n-octane and C8 isomers on Ni-containing zeolites
A Lugstein, A Jentys, H Vinek
Applied Catalysis A: General 176 (1), 119-128, 1999
Integrating micro-and nanoelectrodes into atomic force microscopy cantilevers using focused ion beam techniques
A Lugstein, E Bertagnolli, C Kranz, A Kueng, B Mizaikoff
Applied physics letters 81 (2), 349-351, 2002
Atomic scale alignment of copper-germanide contacts for ge nanowire metal oxide field effect transistors
T Burchhart, A Lugstein, YJ Hyun, G Hochleitner, E Bertagnolli
Nano letters 9 (11), 3739-3742, 2009
Current density profile extraction of focused ion beams based on atomic force microscopy contour profiling of nanodots
A Lugstein, B Basnar, G Hobler, E Bertagnolli
Journal of applied physics 92 (7), 4037-4042, 2002
Simulation of ion beam induced micro/nano fabrication
HB Kim, G Hobler, A Lugstein, E Bertagnolli
Journal of Micromechanics and Microengineering 17 (6), 1178, 2007
Numerical Simulation of Scanning Electrochemical Microscopy Experiments with Frame-Shaped Integrated Atomic Force Microscopy− SECM Probes Using the Boundary Element Method
O Sklyar, A Kueng, C Kranz, B Mizaikoff, A Lugstein, E Bertagnolli, ...
Analytical chemistry 77 (3), 764-771, 2005
Fabrication of a ring nanoelectrode in an AFM tip: novel approach towards simultaneous electrochemical and topographical imaging
A Lugstein, E Bertagnolli, C Kranz, B Mizaikoff
Surface and Interface Analysis: An International Journal devoted to the …, 2002
Comparison of impregnation, liquid-and solid-state ion exchange procedures for the incorporation of nickel in HMFI, HMOR and HBEA: Activity and selectivity in n-nonane …
G Kinger, A Lugstein, R Swagera, M Ebel, A Jentys, H Vinek
Microporous and mesoporous materials 39 (1-2), 307-317, 2000
Simulation of ion beam direct structuring for 3D nanoimprint template fabrication
E Platzgummer, A Biedermann, H Langfischer, S Eder-Kapl, M Kuemmel, ...
Microelectronic Engineering 83 (4-9), 936-939, 2006
The system can't perform the operation now. Try again later.
Articles 1–20