| Integrating an ultramicroelectrode in an AFM cantilever: combined technology for enhanced information C Kranz, G Friedbacher, B Mizaikoff, A Lugstein, J Smoliner, E Bertagnolli Analytical chemistry 73 (11), 2491-2500, 2001 | 350 | 2001 |
| Deep-ultraviolet solar-blind photoconductivity of individual gallium oxide nanobelts L Li, E Auer, M Liao, X Fang, T Zhai, UK Gautam, A Lugstein, Y Koide, ... Nanoscale 3 (3), 1120-1126, 2011 | 164 | 2011 |
| Integrated AFM–SECM in tapping mode: simultaneous topographical and electrochemical imaging of enzyme activity A Kueng, C Kranz, A Lugstein, E Bertagnolli, B Mizaikoff Angewandte Chemie International Edition 42 (28), 3238-3240, 2003 | 151 | 2003 |
| Pressure-induced orientation control of the growth of epitaxial silicon nanowires A Lugstein, M Steinmair, YJ Hyun, G Hauer, P Pongratz, E Bertagnolli Nano letters 8 (8), 2310-2314, 2008 | 113 | 2008 |
| Anomalous piezoresistance effect in ultrastrained silicon nanowires A Lugstein, M Steinmair, A Steiger, H Kosina, E Bertagnolli Nano letters 10 (8), 3204-3208, 2010 | 111 | 2010 |
| Tuning the electro-optical properties of germanium nanowires by tensile strain J Greil, A Lugstein, C Zeiner, G Strasser, E Bertagnolli Nano letters 12 (12), 6230-6234, 2012 | 108 | 2012 |
| Mapping of enzyme activity by detection of enzymatic products during AFM imaging with integrated SECM–AFM probes C Kranz, A Kueng, A Lugstein, E Bertagnolli, B Mizaikoff Ultramicroscopy 100 (3-4), 127-134, 2004 | 90 | 2004 |
| AFM‐Tip‐Integrated Amperometric Microbiosensors: High‐Resolution Imaging of Membrane Transport A Kueng, C Kranz, A Lugstein, E Bertagnolli, B Mizaikoff Angewandte Chemie 117 (22), 3485-3488, 2005 | 89 | 2005 |
| FIB processing of silicon in the nanoscale regime A Lugstein, B Basnar, J Smoliner, E Bertagnolli Applied Physics A 76 (4), 545-548, 2003 | 86 | 2003 |
| Full three-dimensional simulation of focused ion beam micro/nanofabrication HB Kim, G Hobler, A Steiger, A Lugstein, E Bertagnolli Nanotechnology 18 (24), 245303, 2007 | 85 | 2007 |
| Hydroisomerization and cracking of n-octane and C8 isomers on Ni-containing zeolites A Lugstein, A Jentys, H Vinek Applied Catalysis A: General 176 (1), 119-128, 1999 | 76 | 1999 |
| Combined scanning electrochemical atomic force microscopy for tapping mode imaging A Kueng, C Kranz, B Mizaikoff, A Lugstein, E Bertagnolli Applied physics letters 82 (10), 1592-1594, 2003 | 75 | 2003 |
| Integrating micro-and nanoelectrodes into atomic force microscopy cantilevers using focused ion beam techniques A Lugstein, E Bertagnolli, C Kranz, A Kueng, B Mizaikoff Applied physics letters 81 (2), 349-351, 2002 | 72 | 2002 |
| Current density profile extraction of focused ion beams based on atomic force microscopy contour profiling of nanodots A Lugstein, B Basnar, G Hobler, E Bertagnolli Journal of applied physics 92 (7), 4037-4042, 2002 | 65 | 2002 |
| Atomic scale alignment of copper-germanide contacts for ge nanowire metal oxide field effect transistors T Burchhart, A Lugstein, YJ Hyun, G Hochleitner, E Bertagnolli Nano letters 9 (11), 3739-3742, 2009 | 62 | 2009 |
| Simulation of ion beam induced micro/nano fabrication HB Kim, G Hobler, A Lugstein, E Bertagnolli Journal of Micromechanics and Microengineering 17 (6), 1178, 2007 | 61 | 2007 |
| Numerical Simulation of Scanning Electrochemical Microscopy Experiments with Frame-Shaped Integrated Atomic Force Microscopy− SECM Probes Using the Boundary Element Method O Sklyar, A Kueng, C Kranz, B Mizaikoff, A Lugstein, E Bertagnolli, ... Analytical chemistry 77 (3), 764-771, 2005 | 59 | 2005 |
| Comparison of impregnation, liquid-and solid-state ion exchange procedures for the incorporation of nickel in HMFI, HMOR and HBEA: Activity and selectivity in n-nonane … G Kinger, A Lugstein, R Swagera, M Ebel, A Jentys, H Vinek Microporous and mesoporous materials 39 (1-2), 307-317, 2000 | 56 | 2000 |
| Fabrication of a ring nanoelectrode in an AFM tip: novel approach towards simultaneous electrochemical and topographical imaging A Lugstein, E Bertagnolli, C Kranz, B Mizaikoff Surface and Interface Analysis: An International Journal devoted to the …, 2002 | 55 | 2002 |
| Simulation of ion beam direct structuring for 3D nanoimprint template fabrication E Platzgummer, A Biedermann, H Langfischer, S Eder-Kapl, M Kuemmel, ... Microelectronic Engineering 83 (4-9), 936-939, 2006 | 53 | 2006 |
