Colin Humphreys
Titel
Zitiert von
Zitiert von
Jahr
Electron-energy-loss spectra and the structural stability of nickel oxide: An LSDA+ U study
SL Dudarev, GA Botton, SY Savrasov, CJ Humphreys, AP Sutton
Physical Review B 57 (3), 1505, 1998
85321998
Solid-state lighting
CJ Humphreys
MRS bulletin 33 (4), 459-470, 2008
4012008
Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope
TM Smeeton, MJ Kappers, JS Barnard, ME Vickers, CJ Humphreys
Applied Physics Letters 83 (26), 5419-5421, 2003
3252003
The scattering of fast electrons by crystals
CJ Humphreys
Reports on Progress in Physics 42 (11), 1825, 1979
2881979
Prospects of III-nitride optoelectronics grown on Si
D Zhu, DJ Wallis, CJ Humphreys
Reports on Progress in Physics 76 (10), 106501, 2013
2872013
Absorption parameters in electron diffraction theory
PBH CJ Humphreys
Philosophical Magazine 18, 115-122, 1968
2781968
Luminescence from erbium-doped silicon nanocrystals in silica: Excitation mechanisms
AJ Kenyon, CE Chryssou, CW Pitt, T Shimizu-Iwayama, DE Hole, ...
Journal of Applied Physics 91 (1), 367-374, 2002
2442002
Optical and microstructural studies of single-quantum-well structures
DM Graham, A Soltani-Vala, P Dawson, MJ Godfrey, TM Smeeton, ...
Journal of applied physics 97 (10), 103508, 2005
2392005
Critical thickness calculations for InGaN/GaN
D Holec, P Costa, MJ Kappers, CJ Humphreys
Journal of Crystal Growth 303 (1), 314-317, 2007
2092007
Correlation of contact resistance with microstructure for Au/Ni/Al/Ti/AlGaN/GaN ohmic contacts using transmission electron microscopy
AN Bright, PJ Thomas, M Weyland, DM Tricker, CJ Humphreys, R Davies
Journal of Applied Physics 89 (6), 3143-3150, 2001
1952001
Three-dimensional atom probe studies of an multiple quantum well structure: Assessment of possible indium clustering
MJ Galtrey, RA Oliver, MJ Kappers, CJ Humphreys, DJ Stokes, PH Clifton, ...
Applied physics letters 90 (6), 061903, 2007
1942007
Carrier localization mechanisms in In x Ga 1− x N/GaN quantum wells
D Watson-Parris, MJ Godfrey, P Dawson, RA Oliver, MJ Galtrey, ...
Physical Review B 83 (11), 115321, 2011
1832011
Dislocation nucleation near the critical thickness in GeSi/Si strained layers
DJ Eaglesham, EP Kvam, DM Maher, CJ Humphreys, JC Bean
Philosophical Magazine A 59 (5), 1059-1073, 1989
1731989
Machine learning predicts laboratory earthquakes
B Rouet‐Leduc, C Hulbert, N Lubbers, K Barros, CJ Humphreys, ...
Geophysical Research Letters 44 (18), 9276-9282, 2017
1622017
InGaN quantum dots grown by metalorganic vapor phase epitaxy employing a post-growth nitrogen anneal
RA Oliver, GAD Briggs, MJ Kappers, CJ Humphreys, S Yasin, JH Rice, ...
Applied Physics Letters 83 (4), 755-757, 2003
1612003
Chemical mapping and formation of V-defects in InGaN multiple quantum wells
N Sharma, P Thomas, D Tricker, C Humphreys
Applied Physics Letters 77 (9), 1274-1276, 2000
1582000
Dopant profiling with the scanning electron microscope—A study of Si
SL Elliott, RF Broom, CJ Humphreys
Journal of applied physics 91 (11), 9116-9122, 2002
1532002
Carrier leakage in InGaN quantum well light-emitting diodes emitting at 480 nm
IA Pope, PM Smowton, P Blood, JD Thomson, MJ Kappers, ...
Applied Physics Letters 82 (17), 2755-2757, 2003
1452003
Understanding x-ray diffraction of nonpolar gallium nitride films
MA Moram, CF Johnston, JL Hollander, MJ Kappers, CJ Humphreys
Journal of Applied Physics 105 (11), 113501, 2009
1442009
A dynamical theory for the contrast of perfect and imperfect crystals in the scanning electron microscope using backscattered electrons
CJHPBH JP Spencer
Philosophical Magazine 26, 193-213, 1972
1421972
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