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Satoshi Yagi
Satoshi Yagi
Nippon Telegraph and Telephone Corporation
Bestätigte E-Mail-Adresse bei toke.jp
Titel
Zitiert von
Zitiert von
Jahr
Variational autoencoder with implicit optimal priors
H Takahashi, T Iwata, Y Yamanaka, M Yamada, S Yagi
Proceedings of the AAAI Conference on Artificial Intelligence 33 (01), 5066-5073, 2019
692019
Student-t Variational Autoencoder for Robust Density Estimation.
H Takahashi, T Iwata, Y Yamanaka, M Yamada, S Yagi
IJCAI, 2696-2702, 2018
432018
Applying Auto-ID to the Japanese publication business to deliver advanced supply chain management, innovative retail applications, and convenient and safe reader services
T Ishikawa, Y Yumoto, M Kurata, M Endo, S Kinoshita, F Hoshino, S Yagi, ...
Auto-ID Center, Keio University, 2003
292003
Efficient Ising model mapping for induced subgraph isomorphism problems using Ising machines
N Yoshimura, M Tawada, S Tanaka, J Arai, S Yagi, H Uchiyama, ...
2019 IEEE 9th International Conference on Consumer Electronics (ICCE-Berlin …, 2019
132019
Applying auto-id to the japanese publication business
T Ishikawa, Y Yumoto, M Kurata, M Endo, S Kinoshita, F Hoshino, S Yagi, ...
White Paper KEI-AUTOID-WH-004, Auto-ID Center, Keio University, Shonan …, 2003
102003
Mapping induced subgraph isomorphism problems to ising models and its evaluations by an ising machine
N Yoshimura, M Tawada, S Tanaka, J Arai, S Yagi, H Uchiyama, ...
IEICE TRANSACTIONS on Information and Systems 104 (4), 481-489, 2021
32021
A quasi-initial solution giving method for Ising machines by controlling external magnetic field coefficients
S Kawakami, K Ohno, D Ba, S Yagi, J Teramoto, N Togawa
2023 IEEE International Conference on Consumer Electronics (ICCE), 1-6, 2023
22023
Detecting device, detecting method, and detecting program
H Takahashi, T Iwata, Y Yamanaka, M Yamada, S Yagi
US Patent App. 17/253,131, 2021
22021
An Evaluation Method of Combined Authentication Techniques Including Biometric Authentication Techniques
I Ueno, S Yagi, J Yamada, T Kitagawa, H Takasugi
IEICE Technical Report; IEICE Tech. Rep. 110 (372), 1-6, 2011
22011
Giving a quasi-initial solution to Ising machines by controlling external magnetic field coefficients
S Kawakami, K Ohno, D Ba, S Yagi, J Teramoto, N Togawa
IEICE Transactions on Fundamentals of Electronics, Communications and …, 2024
12024
Ising-machine-based solver for constrained graph coloring problems
S Kawakami, Y Mukasa, S Bao, D Ba, J Arai, S Yagi, J Teramoto, ...
IEICE Transactions on Fundamentals of Electronics, Communications and …, 2024
12024
A Constrained Graph Coloring Solver Based on Ising Machines
S Kawakami, Y Mukasa, S Bao, D Ba, J Arai, S Yagi, J Teramoto, ...
2023 IEEE International Conference on Consumer Electronics (ICCE), 1-6, 2023
12023
Learning device, learning method, and learning program
H Takahashi, T Iwata, S Kanai, A Kumagai, Y Yamanaka, M Yamada, ...
US Patent App. 17/777,074, 2022
12022
An Interaction Coefficient Control Method for Setting Initial Solutions to Ising Machines
S Kawakami, K Ohno, D Ba, S Yagi, J Teramoto, N Togawa
2024 IEEE International Conference on Consumer Electronics (ICCE), 1-2, 2024
2024
Student-t Variational Autoencoder for Robust Multivariate Density EstimationStudent-t VAE によるロバスト確率密度推定
H Takahashi, T Iwata, Y Yamanaka, M Yamada, S Yagi, H Kashima
2021
Advanced Learning Technologies for Deep Learning
Y Ida, S Kanai, Y Fujiwara, S Yagi, Y Iida
NTT Technical Review 16 (8), 2018
2018
An Architecture of A Multifactor Authentication Platform for Hybrid Cloud
S Yagi, R Kasuga, S Imamura, J Yamada, H Takasugi
IEICE Technical Report; IEICE Tech. Rep. 111 (81), 7-12, 2011
2011
Development of Multifactor Authentication Platform with a Single Sign-On Function
J Yamada, S Yagi, I Ueno, T Kitagawa, H Takasugi
IEICE Technical Report; IEICE Tech. Rep. 110 (266), 47-52, 2010
2010
Discription and Proccessing for Right to Use
S Yagi, Y Sueda, M Ueno, H Takiguchi, H Kitami, T Kobayashi, Y Kondo
IEICE Technical Report; IEICE Tech. Rep. 105 (357), 13-16, 2005
2005
Ubuquitous Service Rights Management Protocol--
H Takiguchi, M Ueno, Y Sueda, S Yagi, H Kitami, T Kobayashi, Y Kondo
IEICE Technical Report; IEICE Tech. Rep. 104 (690), 145-148, 2005
2005
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