| Kelvin probe force microscopy M Nonnenmacher, MP o’Boyle, HK Wickramasinghe Applied physics letters 58 (25), 2921-2923, 1991 | 3025 | 1991 |
| Atomic force microscope–force mapping and profiling on a sub 100‐Å scale Y Martin, CC Williams, HK Wickramasinghe Journal of applied Physics 61 (10), 4723-4729, 1987 | 2266 | 1987 |
| Magnetic imaging by ‘‘force microscopy’’with 1000 Å resolution Y Martin, HK Wickramasinghe Applied Physics Letters 50 (20), 1455-1457, 1987 | 1708 | 1987 |
| High‐resolution capacitance measurement and potentiometry by force microscopy Y Martin, DW Abraham, HK Wickramasinghe Applied Physics Letters 52 (13), 1103-1105, 1988 | 1003 | 1988 |
| Scanning interferometric apertureless microscopy: optical imaging at 10 angstrom resolution F Zenhausern, Y Martin, HK Wickramasinghe Science 269 (5227), 1083-1085, 1995 | 895 | 1995 |
| Apertureless near‐field optical microscope F Zenhausern, MP O’boyle, HK Wickramasinghe Applied Physics Letters 65 (13), 1623-1625, 1994 | 777 | 1994 |
| Scanning thermal profiler CC Williams, HK Wickramasinghe Microelectronic Engineering 5 (1-4), 509-513, 1986 | 653 | 1986 |
| Acoustic microscopy with mechanical scanning—a review CF Quate, A Atalar, HK Wickramasinghe Proceedings of the IEEE 67 (8), 1092-1114, 1979 | 459 | 1979 |
| Ultra-high-density phase-change storage and memory HF Hamann, M O'Boyle, YC Martin, M Rooks, HK Wickramasinghe Nature materials 5 (5), 383-387, 2006 | 401 | 2006 |
| Strength of the electric field in apertureless near-field optical microscopy YC Martin, HF Hamann, HK Wickramasinghe Journal of applied physics 89 (10), 5774-5778, 2001 | 314 | 2001 |
| Scanned-probe microscopes HK Wickramasinghe Scientific American 261 (4), 98-105, 1989 | 300 | 1989 |
| Nanoscale chemical imaging by photoinduced force microscopy D Nowak, W Morrison, HK Wickramasinghe, J Jahng, E Potma, L Wan, ... Science advances 2 (3), e1501571, 2016 | 299 | 2016 |
| Structure for confining the switching current in phase memory (PCM) cells GW Burr, CH Lam, S Raoux, SM Rossnagel, AG Schrott, JZ Sun, ... US Patent 7,488,967, 2009 | 284 | 2009 |
| Method for imaging sidewalls by atomic force microscopy Y Martin, HK Wickramasinghe Applied Physics Letters 64 (19), 2498-2500, 1994 | 266 | 1994 |
| High‐resolution magnetic imaging of domains in TbFe by force microscopy Y Martin, D Rugar, HK Wickramasinghe Applied Physics Letters 52 (3), 244-246, 1988 | 258 | 1988 |
| Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy CC Williams, J Slinkman, WP Hough, HK Wickramasinghe Applied Physics Letters 55 (16), 1662-1664, 1989 | 256 | 1989 |
| Scanning probe microscopy of thermal conductivity and subsurface properties M Nonnenmacher, HK Wickramasinghe Applied Physics Letters 61 (2), 168-170, 1992 | 245 | 1992 |
| Phase-change memory cell and method of fabricating the phase-change memory cell JZ Sun, S Raoux, H Wichramasinghe US Patent 6,936,840, 2005 | 240 | 2005 |
| Image force microscopy of molecular resonance: A microscope principle I Rajapaksa, K Uenal, HK Wickramasinghe Applied physics letters 97 (7), 2010 | 184 | 2010 |
| Phase imaging in reflection with the acoustic microscope A Atalar, CF Quate, HK Wickramasinghe Applied Physics Letters 31 (12), 791-793, 1977 | 178 | 1977 |
