| CASP: Concurrent autonomous chip self-test using stored test patterns Y Li, S Makar, S Mitra Proceedings of the conference on Design, automation and test in Europe, 885-890, 2008 | 209 | 2008 |
| QED: Quick error detection tests for effective post-silicon validation T Hong, Y Li, SB Park, D Mui, D Lin, ZA Kaleq, N Hakim, H Naeimi, ... 2010 IEEE International Test Conference, 1-10, 2010 | 127 | 2010 |
| Diagonal quadratic approximation for parallelization of analytical target cascading Y Li, Z Lu, JJ Michalek | 100 | 2008 |
| Overcoming early-life failure and aging for robust systems Y Li, YM Kim, E Mintarno, DS Gardner, S Mitra IEEE Design & Test of Computers 26 (6), 28-39, 2009 | 95 | 2009 |
| Robust system design to overcome CMOS reliability challenges S Mitra, K Brelsford, YM Kim, HHK Lee, Y Li IEEE Journal on Emerging and Selected Topics in Circuits and Systems 1 (1 …, 2011 | 85 | 2011 |
| VAST: Virtualization-assisted concurrent autonomous self-test H Inoue, Y Li, S Mitra 2008 IEEE International Test Conference, 1-10, 2008 | 74 | 2008 |
| Effective post-silicon validation of system-on-chips using quick error detection D Lin, T Hong, Y Li, S Eswaran, S Kumar, F Fallah, N Hakim, DS Gardner, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014 | 62 | 2014 |
| Fidelity: Efficient resilience analysis framework for deep learning accelerators Y He, P Balaprakash, Y Li 2020 53rd Annual IEEE/ACM International Symposium on Microarchitecture …, 2020 | 57 | 2020 |
| Operating system scheduling for efficient online self-test in robust systems Y Li, O Mutlu, S Mitra Proceedings of the 2009 International Conference on Computer-Aided Design …, 2009 | 52 | 2009 |
| Concurrent autonomous self-test for uncore components in system-on-chips Y Li, O Mutlu, DS Gardner, S Mitra 2010 28th VLSI Test Symposium (VTS), 232-237, 2010 | 49 | 2010 |
| The resilience wall: Cross-layer solution strategies S Mitra, P Bose, E Cheng, CY Cher, H Cho, R Joshi, YM Kim, CR Lefurgy, ... Proceedings of Technical Program-2014 International Symposium on VLSI …, 2014 | 48 | 2014 |
| Protecting page tables from rowhammer attacks using monotonic pointers in dram true-cells XC Wu, T Sherwood, FT Chong, Y Li Proceedings of the Twenty-Fourth International Conference on Architectural …, 2019 | 39 | 2019 |
| Self-repair of uncore components in robust system-on-chips: An opensparc t2 case study Y Li, E Cheng, S Makar, S Mitra 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 30 | 2013 |
| Cross-layer error resilience for robust systems L Leem, H Cho, HH Lee, YM Kim, Y Li, S Mitra 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 177-180, 2010 | 23 | 2010 |
| Robust system design S Mitra, H Cho, T Hong, YM Kim, HHK Lee, L Leem, Y Li, D Lin, ... IPSJ Transactions on System and LSI Design Methodology 4, 2-30, 2011 | 19 | 2011 |
| Overcoming post-silicon validation challenges through quick error detection (QED) D Lin, T Hong, Y Li, F Fallah, DS Gardner, N Hakim, S Mitra 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 320-325, 2013 | 14 | 2013 |
| Baldur: A power-efficient and scalable network using all-optical switches MR Jokar, J Qiu, FT Chong, LL Goddard, JM Dallesasse, M Feng, Y Li 2020 IEEE International Symposium on High Performance Computer Architecture …, 2020 | 12 | 2020 |
| Cross-layer resilience: Challenges, insights, and the road ahead E Cheng, J Abraham, P Bose, A Buyuktosunoglu, D Chen, H Cho, Y Li, ... Proceedings of the 56th Annual Design Automation Conference 2019, 1-4, 2019 | 11 | 2019 |
| Online self-test, diagnostics, and self-repair for robust system design Y Li Stanford University, 2013 | 7 | 2013 |
| Direct-modulated optical networks for interposer systems MR Jokar, L Zhang, JM Dallesasse, FT Chong, Y Li Proceedings of the 13th IEEE/ACM International Symposium on Networks-on-Chip …, 2019 | 6 | 2019 |
