| Integrating an ultramicroelectrode in an AFM cantilever: combined technology for enhanced information C Kranz, G Friedbacher, B Mizaikoff, A Lugstein, J Smoliner, E Bertagnolli Analytical chemistry 73 (11), 2491-2500, 2001 | 396 | 2001 |
| Calibrated nanoscale capacitance measurements using a scanning microwave microscope HP Huber, M Moertelmaier, TM Wallis, CJ Chiang, M Hochleitner, A Imtiaz, ... Review of Scientific Instruments 81 (11), 2010 | 172 | 2010 |
| Momentum conservation in tunneling processes between barrier-separated 2D-electron-gas systems J Smoliner, W Demmerle, G Berthold, E Gornik, G Weimann, W Schlapp Physical review letters 63 (19), 2116, 1989 | 126 | 1989 |
| Calibrated nanoscale dopant profiling using a scanning microwave microscope HP Huber, I Humer, M Hochleitner, M Fenner, M Moertelmaier, C Rankl, ... Journal of Applied Physics 111 (1), 2012 | 120 | 2012 |
| FIB processing of silicon in the nanoscale regime A Lugstein, B Basnar, J Smoliner, E Bertagnolli Applied Physics A 76, 545-548, 2003 | 96 | 2003 |
| Tunneling spectroscopy in barrier-separated two-dimensional electron-gas systems W Demmerle, J Smoliner, G Berthold, E Gornik, G Weimann, W Schlapp Physical Review B 44 (7), 3090, 1991 | 68 | 1991 |
| Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy E Brinciotti, G Gramse, S Hommel, T Schweinboeck, A Altes, MA Fenner, ... Nanoscale 7 (35), 14715-14722, 2015 | 65 | 2015 |
| Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope A Imtiaz, TM Wallis, SH Lim, H Tanbakuchi, HP Huber, A Hornung, ... Journal of Applied Physics 111 (9), 2012 | 55 | 2012 |
| Hot electron spectroscopy and microscopy J Smoliner, D Rakoczy, M Kast Reports on Progress in Physics 67 (10), 1863, 2004 | 45 | 2004 |
| Depletion charge measurements by tunneling spectroscopy GaAs‐GaAlAs field‐effect transistors J Smoliner, E Gornik, G Weimann Applied physics letters 52 (25), 2136-2138, 1988 | 45 | 1988 |
| Scanning microwave microscopy/spectroscopy on metal-oxide-semiconductor systems J Smoliner, HP Huber, M Hochleitner, M Moertelmaier, F Kienberger Journal of Applied Physics 108 (6), 2010 | 44 | 2010 |
| Mechanism of bias-dependent contrast in scanning-capacitance-microscopy images J Smoliner, B Basnar, S Golka, E Gornik, B Löffler, M Schatzmayr, ... Applied Physics Letters 79 (19), 3182-3184, 2001 | 40 | 2001 |
| Quantitative scanning capacitance spectroscopy W Brezna, M Schramböck, A Lugstein, S Harasek, H Enichlmair, ... Applied physics letters 83 (20), 4253-4255, 2003 | 35 | 2003 |
| Electron refraction in ballistic electron-emission microscopy studied by a superlattice energy filter J Smoliner, R Heer, C Eder, G Strasser Physical Review B 58 (12), R7516, 1998 | 35 | 1998 |
| Tunnelling spectroscopy of low-dimensional states J Smoliner Semiconductor science and technology 11 (1), 1, 1996 | 33 | 1996 |
| Magnetoresistance in dotlike and antidotlike structures G Berthold, J Smoliner, V Rosskopf, E Gornik, G Böhm, G Weimann Physical Review B 45 (19), 11350, 1992 | 33* | 1992 |
| Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric O Bethge, C Henkel, S Abermann, G Pozzovivo, M Stoeger-Pollach, ... Applied surface science 258 (8), 3444-3449, 2012 | 32 | 2012 |
| Energy levels in quantum wires studied by tunneling and magnetotransport experiments F Hirler, J Smoliner, E Gornik, G Weimann, W Schlapp Applied physics letters 57 (3), 261-263, 1990 | 32 | 1990 |
| Metal-organic chemical vapor deposition and nanoscale characterization of zirconium oxide thin films S Harasek, HD Wanzenboeck, B Basnar, J Smoliner, J Brenner, H Störi, ... Thin Solid Films 414 (2), 199-204, 2002 | 29 | 2002 |
| Floating electrometer for scanning tunneling microscope applications in the femtoampere range R Heer, C Eder, J Smoliner, E Gornik Review of scientific instruments 68 (12), 4488-4491, 1997 | 29 | 1997 |
