Boyang Du
Title
Cited by
Cited by
Year
On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors
P Bernardi, R Cantoro, L Ciganda, B Du, E Sánchez, MS Reorda, ...
2013 14th International Workshop on Microprocessor Test and Verification, 52-57, 2013
172013
Online test of control flow errors: A new debug interface-based approach
B Du, MS Reorda, L Sterpone, L Parra, M Portela-García, A Lindoso, ...
IEEE Transactions on Computers 65 (6), 1846-1855, 2015
162015
A new hybrid nonintrusive error-detection technique using dual control-flow monitoring
L Parra, A Lindoso, M Portela-Garcia, L Entrena, B Du, MS Reorda, ...
IEEE Transactions on Nuclear Science 61 (6), 3236-3243, 2014
142014
An extended model to support detailed GPGPU reliability analysis
B Du, JER Condia, MS Reorda
2019 14th International Conference on Design & Technology of Integrated …, 2019
112019
About the functional test of the GPGPU scheduler
B Du, JER Condia, MS Reorda, L Sterpone
2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018
112018
Analysis and mitigation of single event effects on flash-based FPGAs
L Sterpone, B Du
2014 19th IEEE European Test Symposium (ETS), 1-6, 2014
112014
On the prediction of radiation-induced SETs in flash-based FPGAs
S Azimi, B Du, L Sterpone
Microelectronics Reliability 64, 230-234, 2016
82016
A new CAD tool for Single Event Transient Analysis and mitigation on Flash-based FPGAs
S Azimi, B Du, L Sterpone, DM Codinachs, R Grimoldi, L Cattaneo
Integration 67, 73-81, 2019
72019
Ultrahigh energy heavy ion test beam on Xilinx Kintex-7 SRAM-based FPGA
B Du, L Sterpone, S Azimi, DM Codinachs, V Ferlet-Cavrois, CB Polo, ...
IEEE Transactions on Nuclear Science 66 (7), 1813-1819, 2019
72019
On the reliability of convolutional neural network implementation on SRAM-based FPGA
B Du, S Azimi, C De Sio, L Bozzoli, L Sterpone
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019
62019
Exploiting the debug interface to support on-line test of control flow errors
B Du, MS Reorda, L Sterpone, L Parra, M Portela-García, A Lindoso, ...
2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 98-103, 2013
62013
FlexGripPlus: An improved GPGPU model to support reliability analysis
JER Condia, B Du, MS Reorda, L Sterpone
Microelectronics Reliability 109, 113660, 2020
52020
FPGA-controlled PCBA power-on self-test using processor's debug features
B Du, E Sánchez, MS Reorda, JP Acle, A Tsertov
2016 IEEE 19th International Symposium on Design and Diagnostics of …, 2016
52016
Fault-tolerance techniques for soft-core processors using the trace interface
L Entrena, A Lindoso, M Portela-Garcia, L Parra, B Du, MS Reorda, ...
FPGAs and Parallel Architectures for Aerospace Applications, 293-306, 2016
52016
Radiation-induced single event transients modeling and testing on nanometric flash-based technologies
L Sterpone, B Du, S Azimi
Microelectronics Reliability 55 (9-10), 2087-2091, 2015
52015
Analysis and mitigation of SEUs in ARM-based SoC on Xilinx Virtex-V SRAM-based FPGAs
B Du, M Desogus, L Sterpone
2015 11th Conference on Ph. D. Research in Microelectronics and Electronics …, 2015
52015
A functional test algorithm for the register forwarding and pipeline interlocking unit in pipelined microprocessors
P Bernardi, D Boyang, L Ciganda, E Sánchez, MS Reorda, M Grosso, ...
2013 8th IEEE Design and Test Symposium, 1-6, 2013
52013
Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect
C De Sio, S Azimi, L Sterpone, B Du
IEEE Access 7, 140182-140189, 2019
42019
On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs
S Azimi, L Sterpone, B Du, L Boragno
Microelectronics Reliability 88, 936-940, 2018
42018
Effective Mitigation of Radiation-induced Single Event Transient on Flash-based FPGAs
L Sterpone, S Azimi, B Du, DM Codinachs, R Grimoldi
Proceedings of the on Great Lakes Symposium on VLSI 2017, 203-208, 2017
42017
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Articles 1–20