An AlN/Al0.85 Ga0.15 N high electron mobility transistor AG Baca, AM Armstrong, AA Allerman, EA Douglas, CA Sanchez, ...
Applied Physics Letters 109 (3), 033509, 2016
133 2016 Ultra-wide-bandgap AlGaN power electronic devices RJ Kaplar, AA Allerman, AM Armstrong, MH Crawford, JR Dickerson, ...
ECS Journal of Solid State Science and Technology 6 (2), Q3061, 2016
132 2016 High mobility W Lim, EA Douglas, SH Kim, DP Norton, SJ Pearton, F Ren, H Shen, ...
Applied Physics Letters 94 (7), 072103, 2009
113 2009 Low-voltage indium gallium zinc oxide thin film transistors on paper substrates W Lim, EA Douglas, DP Norton, SJ Pearton, F Ren, YW Heo, SY Son, ...
Applied Physics Letters 96 (5), 053510, 2010
91 2010 Degradation mechanisms for GaN and GaAs high speed transistors DJ Cheney, EA Douglas, L Liu, CF Lo, BP Gila, F Ren, SJ Pearton
Materials 5 (12), 2498-2520, 2012
64 2012 Electric-field-driven degradation in off-state step-stressed AlGaN/GaN high-electron mobility transistors CY Chang, EA Douglas, J Kim, L Lu, CF Lo, BH Chu, DJ Cheney, BP Gila, ...
IEEE Transactions on Device and Materials reliability 11 (1), 187-193, 2011
61 2011 Reliability studies of AlGaN/GaN high electron mobility transistors DJ Cheney, EA Douglas, L Liu, CF Lo, YY Xi, BP Gila, F Ren, D Horton, ...
Semiconductor Science and Technology 28 (7), 074019, 2013
59 2013 Ohmic contacts to Al‐rich AlGaN heterostructures EA Douglas, S Reza, C Sanchez, D Koleske, A Allerman, B Klein, ...
physica status solidi (a) 214 (8), 1600842, 2017
52 2017 RF Performance of Al0.85 Ga0.15 N/Al0.70 Ga0.30 N High Electron Mobility Transistors With 80-nm Gates AG Baca, BA Klein, JR Wendt, SM Lepkowski, CD Nordquist, ...
IEEE Electron Device Letters 40 (1), 17-20, 2018
50 2018 AlGaN/GaN high electron mobility transistor degradation under on-and off-state stress EA Douglas, CY Chang, DJ Cheney, BP Gila, CF Lo, L Lu, R Holzworth, ...
Microelectronics Reliability 51 (2), 207-211, 2011
47 2011 Low-temperature-fabricated W Lim, EA Douglas, SH Kim, DP Norton, SJ Pearton, F Ren, H Shen, ...
Applied Physics Letters 93 (25), 252103, 2008
47 2008 Al0. 85Ga0. 15N/Al0. 70Ga0. 30N high electron mobility transistors with Schottky gates and large on/off current ratio over temperature AG Baca, BA Klein, AA Allerman, AM Armstrong, EA Douglas, ...
ECS Journal of Solid State Science and Technology 6 (12), Q161, 2017
45 2017 Al-rich AlGaN based transistors AG Baca, AM Armstrong, BA Klein, AA Allerman, EA Douglas, RJ Kaplar
Journal of Vacuum Science & Technology A 38 (2), 2020
43 2020 Investigation of the effect of temperature during off-state degradation of AlGaN/GaN high electron mobility transistors EA Douglas, CY Chang, BP Gila, MR Holzworth, KS Jones, L Liu, J Kim, ...
Microelectronics Reliability 52 (1), 23-28, 2012
43 2012 Measurement of EA Douglas, A Scheurmann, RP Davies, BP Gila, H Cho, V Craciun, ...
Applied Physics Letters 98 (24), 242110, 2011
43 2011 Improvement in bias stability of amorphous- W Lim, EA Douglas, DP Norton, SJ Pearton, F Ren, YW Heo, SY Son, ...
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2010
43 2010 Effect of source field plate on the characteristics of off-state, step-stressed AlGaN/GaN high electron mobility transistors L Liu, TS Kang, DA Cullen, L Zhou, J Kim, CY Chang, EA Douglas, S Jang, ...
Journal of Vacuum Science & Technology B 29 (3), 2011
41 2011 Planar ohmic contacts to Al0. 45Ga0. 55N/Al0. 3Ga0. 7N high electron mobility transistors BA Klein, AG Baca, AM Armstrong, AA Allerman, CA Sanchez, ...
ECS Journal of Solid State Science and Technology 6 (11), S3067, 2017
38 2017 Operation Up to 500 °C of Al0.85 Ga0.15 N/Al0.7 Ga0.3 N High Electron Mobility Transistors PH Carey, F Ren, AG Baca, BA Klein, AA Allerman, AM Armstrong, ...
IEEE Journal of the Electron Devices Society 7, 444-452, 2019
37 2019 High temperature operation of Al0. 45Ga0. 55N/Al0. 30Ga0. 70N high electron mobility transistors AG Baca, AM Armstrong, AA Allerman, BA Klein, EA Douglas, ...
ECS Journal of Solid State Science and Technology 6 (11), S3010, 2017
37 2017 
Stephen PeartonProfessor of Materials Science and Engineering, University of FloridaBestätigte E-Mail-Adresse bei mse.ufl.edu
