Jörn Bonse
Jörn Bonse
Bundesanstalt für Materialforschung und –prüfung (BAM), Berlin, Germany
Bestätigte E-Mail-Adresse bei bam.de - Startseite
Titel
Zitiert von
Zitiert von
Jahr
Femtosecond laser ablation of silicon–modification thresholds and morphology
J Bonse, S Baudach, J Krüger, W Kautek, M Lenzner
Applied Physics A 74 (1), 19-25, 2002
7992002
Femtosecond laser-induced periodic surface structures
J Bonse, J Krüger, S Höhm, A Rosenfeld
Journal of Laser Applications 24 (4), 042006, 2012
5842012
On the role of surface plasmon polaritons in the formation of laser-induced periodic surface structures upon irradiation of silicon by femtosecond-laser pulses
J Bonse, A Rosenfeld, J Krüger
Journal of Applied Physics 106 (10), 104910, 2009
5492009
Laser-induced periodic surface structures – a scientific evergreen
J Bonse, S Höhm, SV Kirner, A Rosenfeld, J Krüger
IEEE Journal of Selected Topics in Quantum Electronics 23 (3), 9000615, 2017
5002017
Structure formation on the surface of indium phosphide irradiated by femtosecond laser pulses
J Bonse, M Munz, H Sturm
Journal of Applied Physics 97 (1), 013538, 2005
4112005
Femtosecond laser-induced periodic surface structures revisited: A comparative study on ZnO
D Dufft, A Rosenfeld, SK Das, R Grunwald, J Bonse
Journal of Applied Physics 105 (3), 034908, 2009
3472009
Pulse number dependence of laser-induced periodic surface structures for femtosecond laser irradiation of silicon
J Bonse, J Krüger
Journal of Applied Physics 108 (3), 034903, 2010
3152010
Ultrashort-pulse laser ablation of indium phosphide in air
J Bonse, JM Wrobel, J Krüger, W Kautek
Applied Physics A 72 (1), 89-94, 2001
3022001
Ultrashort pulse laser ablation of polycarbonate and polymethylmethacrylate
S Baudach, J Bonse, J Krüger, W Kautek
Applied Surface Science 154, 555-560, 2000
2732000
Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy
J Bonse, KW Brzezinka, AJ Meixner
Applied Surface Science 221 (1), 215-230, 2004
2412004
Ablation experiments on polyimide with femtosecond laser pulses
S Baudach, J Bonse, W Kautek
Applied Physics A 69 (1), S395-S398, 1999
2051999
Chemical, morphological and accumulation phenomena in ultrashort-pulse laser ablation of TiN in air
J Bonse, H Sturm, D Schmidt, W Kautek
Applied Physics A 71 (6), 657-665, 2000
1722000
Laser ablation thresholds of silicon for different pulse durations: theory and experiment
HO Jeschke, ME Garcia, M Lenzner, J Bonse, J Krüger, W Kautek
Applied Surface Science 197, 839-844, 2002
1702002
Thin film removal mechanisms in ns-laser processing of photovoltaic materials
J Bovatsek, A Tamhankar, RS Patel, NM Bulgakova, J Bonse
Thin Solid Films 518 (10), 2897-2904, 2010
1672010
Femtosecond laser-induced periodic surface structures on silica
S Höhm, A Rosenfeld, J Krüger, J Bonse
Journal of Applied Physics 112 (1), 014901, 2012
1662012
Femtosecond laser-induced periodic surface structures on steel and titanium alloy for tribological applications
J Bonse, R Koter, M Hartelt, D Spaltmann, S Pentzien, S Höhm, ...
Applied Physics A 117 (1), 103-110, 2014
1502014
Sub-100-nm laser-induced periodic surface structures upon irradiation of titanium by Ti: sapphire femtosecond laser pulses in air
J Bonse, S Höhm, A Rosenfeld, J Krüger
Applied Physics A 110 (3), 547-551, 2013
1492013
Dynamics of plasma formation, relaxation, and topography modification induced by femtosecond laser pulses in crystalline and amorphous dielectrics
D Puerto, J Siegel, W Gawelda, M Galvan-Sosa, L Ehrentraut, J Bonse, ...
Journal of the Optical Society of America B 27 (5), 1065-1076, 2010
1202010
Formation of laser-induced periodic surface structures on fused silica upon multiple cross-polarized double-femtosecond-laser-pulse irradiation sequences
M Rohloff, SK Das, S Höhm, R Grunwald, A Rosenfeld, J Krüger, J Bonse
Journal of Applied Physics 110 (1), 014910, 2011
1022011
Femtosecond pulse laser processing of TiN on silicon
J Bonse, P Rudolph, J Krüger, S Baudach, W Kautek
Applied Surface Science 154, 659-663, 2000
1022000
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