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Krishna K. Bhuwalka
Krishna K. Bhuwalka
Other namesK. K. Bhuwalka, K. Bhuwalka
Belgium Research Center, Huawei
Verified email at huawei.com
Title
Cited by
Cited by
Year
Scaling the vertical tunnel FET with tunnel bandgap modulation and gate workfunction engineering
KK Bhuwalka, J Schulze, I Eisele
IEEE transactions on electron devices 52 (5), 909-917, 2005
3952005
Vertical tunnel field-effect transistor
KK Bhuwalka, S Sedlmaier, AK Ludsteck, C Tolksdorf, J Schulze, I Eisele
IEEE Transactions on Electron Devices 51 (2), 279-282, 2004
3292004
Performance enhancement of vertical tunnel field-effect transistor with SiGe in the δp+ layer
KK Bhuwalka, J Schulze, I Eisele
Japanese Journal of Applied Physics 43 (7R), 4073, 2004
2822004
3nm GAA technology featuring multi-bridge-channel FET for low power and high performance applications
G Bae, DI Bae, M Kang, SM Hwang, SS Kim, B Seo, TY Kwon, TJ Lee, ...
2018 IEEE International Electron Devices Meeting (IEDM), 28.7. 1-28.7. 4, 2018
2272018
A simulation approach to optimize the electrical parameters of a vertical tunnel FET
KK Bhuwalka, J Schulze, I Eisele
IEEE transactions on electron devices 52 (7), 1541-1547, 2005
1732005
Fabrication and Analysis of a Heterojunction Line Tunnel FET
AM Walke, A Vandooren, R Rooyackers, D Leonelli, A Hikavyy, R Loo, ...
IEEE Transactions on Electron Devices 61 (3), 707-715, 2014
1432014
P-channel tunnel field-effect transistors down to sub-50 nm channel lengths
KK Bhuwalka, M Born, M Schindler, M Schmidt, T Sulima, I Eisele
Japanese journal of applied physics 45 (4S), 3106, 2006
1312006
Fringing-Induced Drain Current Improvement in the Tunnel Field-Effect Transistor With High- Gate Dielectrics
M Schlosser, KK Bhuwalka, M Sauter, T Zilbauer, T Sulima, I Eisele
IEEE transactions on electron devices 56 (1), 100-108, 2008
1192008
Tunnel field-effect transistor with narrow band-gap channel and strong gate coupling
KK Bhuwalka, KI Goto
US Patent 7,812,370, 2010
922010
Demonstration of scaled Ge p-channel FinFETs integrated on Si
MJH Van Dal, G Vellianitis, G Doornbos, B Duriez, TM Shen, CC Wu, ...
2012 International Electron Devices Meeting, 23.5. 1-23.5. 4, 2012
852012
Tunnel FET: A CMOS device for high temperature applications
M Born, KK Bhuwalka, M Schindler, U Abelein, M Schmidt, T Sulima, ...
2006 25th international conference on microelectronics, 124-127, 2006
762006
Tunnel field-effect transistors with superlattice channels
KK Bhuwalka, CY Wang, KI Goto, WC Lee, CH Diaz
US Patent 7,834,345, 2010
652010
Improved reliability by reduction of hot-electron damage in the vertical impact-ionization MOSFET (I-MOS)
U Abelein, M Born, KK Bhuwalka, M Schindler, M Schlosser, T Sulima, ...
IEEE electron device letters 28 (1), 65-67, 2006
652006
Semiconductor device
KK Bhuwalka, SJ Kim, JC Kim, H Kim
US Patent 10,217,816, 2019
612019
An ultralow-resistance ultrashallow metallic source/drain contact scheme for III–V NMOS
R Oxland, SW Chang, X Li, SW Wang, G Radhakrishnan, W Priyantha, ...
IEEE electron device letters 33 (4), 501-503, 2012
602012
Scaled p-channel Ge FinFET with optimized gate stack and record performance integrated on 300mm Si wafers
B Duriez, G Vellianitis, MJH Van Dal, G Doornbos, R Oxland, ...
2013 IEEE International Electron Devices Meeting, 20.1. 1-20.1. 4, 2013
582013
InAs N-MOSFETs with record performance of Ion= 600 μA/μm at Ioff= 100 nA/μm (Vd= 0.5 V)
SW Chang, X Li, R Oxland, SW Wang, CH Wang, R Contreras-Guerrero, ...
2013 IEEE International Electron Devices Meeting, 16.1. 1-16.1. 4, 2013
472013
A novel vertical impact ionisation MOSFET (I-MOS) concept
U Abelein, M Born, KK Bhuwalka, M Schindler, M Schmidt, T Sulima, ...
2006 25th International Conference on Microelectronics, 121-123, 2006
432006
Tunnel FET and methods for forming the same
KK Bhuwalka, G Doornbos, M Passlack
US Patent 8,471,329, 2013
392013
InAs hole inversion and bandgap interface state density of 2× 1011 cm− 2 eV− 1 at HfO2/InAs interfaces
CH Wang, SW Wang, G Doornbos, G Astromskas, K Bhuwalka, ...
Applied Physics Letters 103 (14), 2013
382013
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