Next-generation crossover-free quantum Hall arrays with superconducting interconnections M Kruskopf, AF Rigosi, AR Panna, M Marzano, D Patel, H Jin, DB Newell, ... Metrologia 56 (6), 065002, 2019 | 59 | 2019 |
Two-terminal and multi-terminal designs for next-generation quantized Hall resistance standards: contact material and geometry M Kruskopf, AF Rigosi, AR Panna, DK Patel, H Jin, M Marzano, M Berilla, ... IEEE transactions on electron devices 66 (9), 3973-3977, 2019 | 56 | 2019 |
Atypical quantized resistances in millimeter-scale epitaxial graphene pn junctions AF Rigosi, D Patel, M Marzano, M Kruskopf, HM Hill, H Jin, J Hu, ... Carbon 154, 230-237, 2019 | 41 | 2019 |
Analytical determination of atypical quantized resistances in graphene pn junctions AF Rigosi, M Marzano, A Levy, HM Hill, DK Patel, M Kruskopf, H Jin, ... Physica B: Condensed Matter 582, 411971, 2020 | 34 | 2020 |
An international comparison of phase angle standards between the novel impedance bridges of CMI, INRIM and METAS M Ortolano, L Palafox, J Kučera, L Callegaro, V D’Elia, M Marzano, ... Metrologia 55 (4), 499, 2018 | 32 | 2018 |
A comprehensive analysis of error sources in electronic fully digital impedance bridges M Ortolano, M Marzano, V D’Elia, NTM Tran, R Rybski, J Kaczmarek, ... IEEE Transactions on Instrumentation and Measurement 70, 1-14, 2020 | 15 | 2020 |
A correlation noise spectrometer for flicker noise measurement in graphene samples M Marzano, A Cultrera, M Ortolano, L Callegaro Measurement Science and Technology 30 (3), 035102, 2019 | 15 | 2019 |
Error modelling of quantum Hall array resistance standards M Marzano, T Oe, M Ortolano, L Callegaro, NH Kaneko Metrologia 55 (2), 167, 2018 | 12 | 2018 |
A fully digital bridge towards the realization of the farad from the quantum Hall effect M Marzano, M Ortolano, V D’Elia, A Müller, L Callegaro Metrologia 58 (1), 015002, 2020 | 11 | 2020 |
Accessing ratios of quantized resistances in graphene p–n junction devices using multiple terminals D Patel, M Marzano, CI Liu, HM Hill, M Kruskopf, H Jin, J Hu, DB Newell, ... AIP Advances 10 (2), 2020 | 11 | 2020 |
Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations M Marzano, M Kruskopf, AR Panna, AF Rigosi, DK Patel, H Jin, S Cular, ... Metrologia 57 (1), 015007, 2020 | 9 | 2020 |
Quantum Hall resistance dartboards using graphene pn junction devices with Corbino geometries CI Liu, DK Patel, M Marzano, M Kruskopf, HM Hill, AF Rigosi AIP Advances 10 (3), 2020 | 7 | 2020 |
Role of plasma-induced defects in the generation of 1/f noise in graphene A Cultrera, L Callegaro, M Marzano, M Ortolano, G Amato Applied Physics Letters 112 (9), 2018 | 6 | 2018 |
Primary realization of inductance and capacitance scales with a fully digital bridge M Marzano, V D’Elia, M Ortolano, L Callegaro IEEE Transactions on Instrumentation and Measurement 71, 1-8, 2022 | 3 | 2022 |
Error sources in electronic fully-digital impedance bridges M Ortolano, M Marzano, V D'Elia, NTM Tran, R Rybski, J Kaczmarek, ... 2020 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2020 | 3 | 2020 |
Superconducting contact geometries for next-generation quantized Hall resistance standards AR Panna, M Kruskopf, AF Rigosi, M Marzano, DK Patel, SU Payagala, ... 2020 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2020 | 3 | 2020 |
The EMPIR project GIQS: Graphene impedance quantum standard L Callegaro, V D'Elia, M Marzano, NTM Tran, M Ortolano, J Kučera, ... 2020 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2020 | 3 | 2020 |
Practical Precision Electrical Impedance Measurement for the 21st Century–EMPIR Project 17RPT04 VersICal O Power, A Ziolek, AE Christensen, A Pokatilov, A Nestor, G Gumez, ... 19th International Congress of Metrology (CIM2019), 02001, 2019 | 3 | 2019 |
A quantum Hall effect Kelvin bridge for resistance calibration M Marzano, L Callegaro, M Ortolano 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 1-2, 2018 | 3 | 2018 |
Virtual Training Laboratory for Primary Impedance Metrology J Kaczmarek, M Ortolano, O Power, J Kučera, L Callegaro, V D'Elia, ... IEEE Transactions on Instrumentation and Measurement 72, 1-12, 2022 | 2 | 2022 |