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Seyoung Oh
Seyoung Oh
Bestätigte E-Mail-Adresse bei chungbuk.ac.kr - Startseite
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Zitiert von
Jahr
Modulation of synaptic plasticity mimicked in al nanoparticle‐embedded IGZO synaptic transistor
J Kim, Y Kim, O Kwon, T Kim, S Oh, S Jin, W Park, JD Kwon, SW Hong, ...
Advanced Electronic Materials 6 (4), 1901072, 2020
522020
Low Power MoS2/Nb2O5 Memtransistor Device with Highly Reliable Heterosynaptic Plasticity
JH Nam, S Oh, HY Jang, O Kwon, H Park, W Park, JD Kwon, Y Kim, B Cho
Advanced Functional Materials 31 (40), 2104174, 2021
432021
Al2O3-Induced Sub-Gap Doping on the IGZO Channel for the Detection of Infrared Light
J Kim, TH Kim, S Oh, JH Nam, HY Jang, Y Kim, N Yamada, H Kobayashi, ...
ACS Applied Electronic Materials 2 (5), 1478-1483, 2020
182020
Brain-inspired ferroelectric Si nanowire synaptic device
M Lee, W Park, H Son, J Seo, O Kwon, S Oh, MG Hahm, UJ Kim, B Cho
APL Materials 9 (3), 2021
162021
Improvement of the Bias Stress Stability in 2D MoS2 and WS2 Transistors with a TiO2 Interfacial Layer
W Park, Y Pak, HY Jang, JH Nam, TH Kim, S Oh, SM Choi, Y Kim, B Cho
Nanomaterials 9 (8), 1155, 2019
122019
MoS2/p-Si heterojunction with graphene interfacial layer for high performance 940 nm infrared photodetector
W Seo, W Park, HY Seo, S Oh, O Kwon, SH Jeong, MJ Kim, SK Lee, ...
Applied Surface Science 604, 154485, 2022
102022
In-depth analysis on electrical parameters of floating gate IGZO synaptic transistor affecting pattern recognition accuracy
O Kwon, S Oh, H Park, SH Jeong, W Park, B Cho
Nanotechnology 33 (21), 215201, 2022
102022
Dual-Terminal Stimulated Heterosynaptic Plasticity of IGZO Memtransistor with Al2O3/TiO2 Double-Oxide Structure
H Park, S Oh, SH Jeong, O Kwon, HY Seo, JD Kwon, Y Kim, W Park, ...
ACS Applied Electronic Materials 4 (6), 2923-2932, 2022
82022
Low Power Switching Characteristics of CNT Field Effect Transistor Device with Al-Doped ZrHfO2 Gate Dielectric
S Oh, SW Lee, D Kim, JH Choi, HC Chae, SM Choi, JH Ahn, B Cho
Journal of Nanomaterials 2018, 2018
52018
Unveiling the Role of Al2O3 Interlayer in Indium–Gallium–Zinc–Oxide Transistors
TH Kim, W Park, S Oh, SY Kim, N Yamada, H Kobayashi, HY Jang, ...
physica status solidi (a) 218 (6), 2000621, 2021
42021
Comprehensive study on trap-induced bias instability via high-pressure D2 and N2 annealing
JY Ku, KS Lee, DH Jung, DH Wang, S Oh, K Lee, B Cho, H Bae, JY Park
IEEE Transactions on Device and Materials Reliability, 2023
22023
Low Power MoS2/Nb2O5 Memtransistor Device with Highly Reliable Heterosynaptic Plasticity (Adv. Funct. Mater. 40/2021)
JH Nam, S Oh, HY Jang, O Kwon, H Park, W Park, JD Kwon, Y Kim, B Cho
Advanced Functional Materials 31 (40), 2170294, 2021
22021
Light-stimulated long-term potentiation behavior enhanced in a HfO2/InGaZnO photonic synapse
S Oh, O Kwon, HY Seo, SH Jeong, HK Park, W Park, B Cho
Applied Materials Today 34, 101919, 2023
12023
Increased Mobility and Reduced Hysteresis of MoS2 Field-Effect Transistors via Direct Surface Precipitation of CsPbBr3-Nanoclusters for Charge Transfer Doping
YZ Kang, GH An, MG Jeon, SJ Shin, SJ Kim, M Choi, JB Lee, TY Kim, ...
Nano Letters 23 (19), 8914-8922, 2023
2023
Conduction Mechanism in Acceptor- or Donor-Doped ZrO2 Bulk and Thin Films
M Kim, S Oh, B Cho, JH Joo
ACS Applied Materials & Interfaces 15 (26), 31627-31634, 2023
2023
Designing Buried-Gate Ingazno Transistors for High-Yield and Reliable Switching Characteristics
DH Kim, S Oh, O Kwon, SH Jeong, HY Seo, E Cho, MJ Kim, W Seo, ...
Available at SSRN 4639296, 0
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