Folgen
Silviu Velicu
Silviu Velicu
EPIR
Bestätigte E-Mail-Adresse bei epir.com
Titel
Zitiert von
Zitiert von
Jahr
Mid-wave infrared HgCdTe nBn photodetector
AM Itsuno, JD Phillips, S Velicu
Applied physics letters 100 (16), 2012
1722012
Design and modeling of HgCdTe nBn detectors
AM Itsuno, JD Phillips, S Velicu
Journal of Electronic Materials 40, 1624-1629, 2011
982011
MBE growth and device processing of MWIR HgCdTe on large area Si substrates
G Brill, S Velicu, P Boieriu, Y Chen, NK Dhar, TS Lee, Y Selamet, ...
Journal of electronic materials 30, 717-722, 2001
652001
Design of an Auger-suppressed unipolar HgCdTe NBνN photodetector
AM Itsuno, JD Phillips, S Velicu
Journal of electronic materials 41, 2886-2892, 2012
612012
Predicted Performance Improvement of Auger-Suppressed HgCdTe Photodiodes andHeterojunction Detectors
AM Itsuno, JD Phillips, S Velicu
IEEE Transactions on Electron Devices 58 (2), 501-507, 2010
582010
Surface morphology and defect formation mechanisms for HgCdTe (211) B grown by molecular beam epitaxy
Y Chang, CR Becker, CH Grein, J Zhao, C Fulk, T Casselman, R Kiran, ...
Journal of electronic materials 37, 1171-1183, 2008
522008
Theoretical and experimental investigation of MWIR HgCdTe nBn detectors
S Velicu, J Zhao, M Morley, AM Itsuno, JD Phillips
Quantum Sensing and Nanophotonic Devices IX 8268, 635-647, 2012
442012
Effects of hydrogen on majority carrier transport and minority carrier lifetimes in long-wavelength infrared HgCdTe on Si
P Boieriu, CH Grein, J Garland, S Velicu, C Fulk, A Stoltz, L Bubulac, ...
Journal of electronic materials 35, 1385-1390, 2006
432006
Modeling of LWIR HgCdTe Auger-suppressed infrared photodiodes under nonequilibrium operation
PY Emelie, S Velicu, CH Grein, JD Phillips, PS Wijewarnasuriya, NK Dhar
Journal of electronic materials 37, 1362-1368, 2008
402008
MWIR and LWIR HgCdTe infrared detectors operated with reduced cooling requirements
S Velicu, CH Grein, PY Emelie, A Itsuno, JD Philips, P Wijewarnasuriya
Journal of electronic materials 39, 873-881, 2010
372010
Molecular beam epitaxy growth of high-quality HgCdTe LWIR layers on polished and repolished CdZnTe substrates
R Singh, S Velicu, J Crocco, Y Chang, J Zhao, LA Almeida, J Markunas, ...
Journal of electronic materials 34, 885-890, 2005
372005
Modeling and design considerations of HgCdTe infrared photodiodes under nonequilibrium operation
PY Emelie, JD Phillips, S Velicu, CH Grein
Journal of electronic materials 36, 846-851, 2007
322007
Broadband long-wavelength infrared Si/SiO2 subwavelength grating reflector
JM Foley, AM Itsuno, T Das, S Velicu, JD Phillips
Optics Letters 37 (9), 1523-1525, 2012
262012
Parameter extraction of HgCdTe infrared photodiodes exhibiting Auger suppression
PY Emelie, JD Phillips, S Velicu, PS Wijewarnasuriya
Journal of Physics D: Applied Physics 42 (23), 234003, 2009
242009
High-performance SWIR HgCdTe FPA development on silicon substrates
R Bommena, JD Bergeson, R Kodama, J Zhao, S Ketharanathan, ...
Infrared Technology and Applications XL 9070, 73-84, 2014
222014
Absorption of narrow-gap HgCdTe near the band edge including nonparabolicity and the urbach tail
Y Chang, S Guha, CH Grein, S Velicu, ME Flatté, V Nathan, ...
Journal of electronic materials 36, 1000-1006, 2007
222007
HgCdTe/CdTe/Si infrared photodetectors grown by MBE for near-room temperature operation
S Velicu, G Badano, Y Selamet, CH Grein, JP Faurie, S Sivananthan, ...
Journal of electronic materials 30, 711-716, 2001
212001
Development of high-performance eSWIR HgCdTe-based focal-plane arrays on silicon substrates
JH Park, J Pepping, A Mukhortova, S Ketharanathan, R Kodama, J Zhao, ...
Journal of electronic materials 45, 4620-4625, 2016
202016
The effect of wet etching on surface properties of HgCdTe
R Sporken, R Kiran, T Casselman, F Aqariden, S Velicu, Y Chang, ...
Journal of electronic materials 38, 1781-1789, 2009
202009
A model for dark current and multiplication in HgCdTe avalanche photodiodes
S Velicu, R Ashokan, S Sivananthan
Journal of Electronic Materials 29, 823-827, 2000
192000
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20