Maheshwar Chandrasekar
Maheshwar Chandrasekar
Bestätigte E-Mail-Adresse bei
Zitiert von
Zitiert von
Guided test generation for isolation and detection of embedded Trojans in ICs
M Banga, M Chandrasekar, L Fang, MS Hsiao
Proceedings of the 18th ACM Great Lakes symposium on VLSI, 363-366, 2008
Search State Compatibility based Incremental Learning Framework and output deviation based X-filling for diagnostic test generation
M Chandrasekar, NP Rahagude, MS Hsiao
Journal of Electronic Testing 26 (2), 165-176, 2010
Fast circuit topology based method to configure the scan chains in illinois scan architecture
S Donglikar, M Banga, M Chandrasekar, MS Hsiao
2009 International Test Conference, 1-10, 2009
A novel diagnostic test generation methodology and its application in production failure isolation
ME Amyeen, D Kim, M Chandrasekar, M Noman, S Venkataraman, A Jain, ...
2016 IEEE International Test Conference (ITC), 1-10, 2016
Diagnostic test generation for silicon diagnosis with an incremental learning framework based on search state compatibility
M Chandrasekar, MS Hsiao
2009 IEEE International High Level Design Validation and Test Workshop, 68-75, 2009
DFT+ DFD: An integrated method for design for testability and diagnosability
N Rahagude, M Chandrasekar, MS Hsiao
2010 19th IEEE Asian Test Symposium, 218-223, 2010
Fault Collapsing Using a Novel Extensibility Relation
M Chandrasekar, MS Hsiao
2011 24th Internatioal Conference on VLSI Design, 268-273, 2011
A Novel Learning Framework for State Space Exploration Based on Search State Extensibility Relation
M Chandrasekar, MS Hsiao
2011 24th Internatioal Conference on VLSI Design, 64-69, 2011
Search State Extensibility based Learning Framework for Model Checking and Test Generation
M Chandrasekar
Virginia Tech, 2010
C preprocessor use in numerical tools: an empirical analysis
EB Allen, M Chandrasekar, KA Sarnowska
Proceedings of the 47th Annual Southeast Regional Conference, 1-6, 2009
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