| Guided test generation for isolation and detection of embedded Trojans in ICs M Banga, M Chandrasekar, L Fang, MS Hsiao Proceedings of the 18th ACM Great Lakes symposium on VLSI, 363-366, 2008 | 122 | 2008 |
| Search State Compatibility based Incremental Learning Framework and output deviation based X-filling for diagnostic test generation M Chandrasekar, NP Rahagude, MS Hsiao Journal of Electronic Testing 26 (2), 165-176, 2010 | 14 | 2010 |
| Fast circuit topology based method to configure the scan chains in Illinois Scan architecture S Donglikar, M Banga, M Chandrasekar, MS Hsiao 2009 International Test Conference, 1-10, 2009 | 14 | 2009 |
| A novel diagnostic test generation methodology and its application in production failure isolation ME Amyeen, D Kim, M Chandrasekar, M Noman, S Venkataraman, A Jain, ... 2016 IEEE International Test Conference (ITC), 1-10, 2016 | 11 | 2016 |
| Diagnostic test generation for silicon diagnosis with an incremental learning framework based on search state compatibility M Chandrasekar, MS Hsiao 2009 IEEE International High Level Design Validation and Test Workshop, 68-75, 2009 | 7 | 2009 |
| DFT+ DFD: An integrated method for design for testability and diagnosability N Rahagude, M Chandrasekar, MS Hsiao 2010 19th IEEE Asian Test Symposium, 218-223, 2010 | 5 | 2010 |
| Fault Collapsing Using a Novel Extensibility Relation M Chandrasekar, MS Hsiao 2011 24th Internatioal Conference on VLSI Design, 268-273, 2011 | 1 | 2011 |
| A Novel Learning Framework for State Space Exploration Based on Search State Extensibility Relation M Chandrasekar, MS Hsiao 2011 24th Internatioal Conference on VLSI Design, 64-69, 2011 | 1 | 2011 |
| Search State Extensibility based Learning Framework for Model Checking and Test Generation M Chandrasekar Virginia Tech, 2010 | | 2010 |
| C preprocessor use in numerical tools: an empirical analysis EB Allen, M Chandrasekar, KA Sarnowska Proceedings of the 47th Annual Southeast Regional Conference, 1-6, 2009 | | 2009 |
