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Jan Steinbrener
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High-resolution protein structure determination by serial femtosecond crystallography
S Boutet, L Lomb, GJ Williams, TRM Barends, A Aquila, RB Doak, ...
Science 337 (6092), 362-364, 2012
9642012
Natively inhibited Trypanosoma brucei cathepsin B structure determined by using an X-ray laser
L Redecke, K Nass, DP DePonte, TA White, D Rehders, A Barty, F Stellato, ...
Science 339 (6116), 227-230, 2013
5212013
Serial time-resolved crystallography of photosystem II using a femtosecond X-ray laser
C Kupitz, S Basu, I Grotjohann, R Fromme, NA Zatsepin, KN Rendek, ...
Nature 513 (7517), 261-265, 2014
5022014
Fractal morphology, imaging and mass spectrometry of single aerosol particles in flight
ND Loh, CY Hampton, AV Martin, D Starodub, RG Sierra, A Barty, ...
Nature 486 (7404), 513-517, 2012
2272012
Radiation damage in protein serial femtosecond crystallography using an x-ray free-electron laser
L Lomb, TRM Barends, S Kassemeyer, A Aquila, SW Epp, B Erk, L Foucar, ...
Physical Review B 84 (21), 214111, 2011
2052011
Soft X-ray diffraction microscopy of a frozen hydrated yeast cell
X Huang, J Nelson, J Kirz, E Lima, S Marchesini, H Miao, AM Neiman, ...
Physical review letters 103 (19), 198101, 2009
1542009
Hyperspectral fruit and vegetable classification using convolutional neural networks
J Steinbrener, K Posch, R Leitner
Computers and Electronics in Agriculture 162, 364-372, 2019
1342019
High-resolution x-ray diffraction microscopy of specifically labeled yeast cells
J Nelson, X Huang, J Steinbrener, D Shapiro, J Kirz, S Marchesini, ...
Proceedings of the National Academy of Sciences 107 (16), 7235-7239, 2010
1312010
Noise-robust coherent diffractive imaging with a single diffraction pattern
AV Martin, F Wang, ND Loh, T Ekeberg, FRNC Maia, M Hantke, ...
Optics Express 20 (15), 16650-16661, 2012
1062012
Single-particle structure determination by correlations of snapshot X-ray diffraction patterns
D Starodub, A Aquila, S Bajt, M Barthelmess, A Barty, C Bostedt, ...
Nature communications 3 (1), 1276, 2012
1022012
Unsupervised classification of single-particle X-ray diffraction snapshots by spectral clustering
CH Yoon, P Schwander, C Abergel, I Andersson, J Andreasson, A Aquila, ...
Optics express 19 (17), 16542-16549, 2011
1002011
Structure of a photosynthetic reaction centre determined by serial femtosecond crystallography
LC Johansson, D Arnlund, G Katona, TA White, A Barty, DP DePonte, ...
Nature communications 4 (1), 2911, 2013
972013
An anti-settling sample delivery instrument for serial femtosecond crystallography
L Lomb, J Steinbrener, S Bari, D Beisel, D Berndt, C Kieser, M Lukat, ...
Journal of applied crystallography 45 (4), 674-678, 2012
792012
Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy
X Huang, H Miao, J Steinbrener, J Nelson, D Shapiro, A Stewart, J Turner, ...
Optics Express 17 (16), 13541-13553, 2009
782009
Femtosecond free-electron laser x-ray diffraction data sets for algorithm development
S Kassemeyer, J Steinbrener, L Lomb, E Hartmann, A Aquila, A Barty, ...
Optics Express 20 (4), 4149-4158, 2012
732012
Femtosecond dark-field imaging with an X-ray free electron laser
AV Martin, ND Loh, CY Hampton, RG Sierra, F Wang, A Aquila, S Bajt, ...
Optics express 20 (12), 13501-13512, 2012
452012
Optimal mapping of x-ray laser diffraction patterns into three dimensions using routing algorithms
S Kassemeyer, A Jafarpour, L Lomb, J Steinbrener, AV Martin, ...
Physical Review E 88 (4), 042710, 2013
432013
Incorrect support and missing center tolerances of phasing algorithms
X Huang, J Nelson, J Steinbrener, J Kirz, JJ Turner, C Jacobsen
Optics express 18 (25), 26441-26449, 2010
382010
Twin robotic x-ray system for 2D radiographic and 3D cone-beam CT imaging
A Fieselmann, J Steinbrener, AK Jerebko, JM Voigt, R Scholz, L Ritschl, ...
Medical Imaging 2016: Physics of Medical Imaging 9783, 128-133, 2016
342016
Data preparation and evaluation techniques for x-ray diffraction microscopy
J Steinbrener, J Nelson, X Huang, S Marchesini, D Shapiro, JJ Turner, ...
Optics express 18 (18), 18598-18614, 2010
342010
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