| Transient non-linear thermal FEM simulation of smart power switches and verification by measurements V Kosel, R Sleik, M Glavanovics 2007 13th International Workshop on Thermal Investigation of ICs and Systems …, 2007 | 24 | 2007 |
| Modular Test System Architecture for Device, Circuit, and System Level Reliability Testing and Condition Monitoring R Sleik, M Glavanovics, S Einspieler, A Muetze, K Krischan IEEE Transactions on Industry Applications 53 (6), 5698-5708, 2017 | 10* | 2017 |
| Cycle stress test equipment for automated short circuit testing of smart power switches according to the AEC Q100-012 standard M Glavanovics, HP Kreuter, R Sleik, C Schreiber 2009 13th European Conference on Power Electronics and Applications, 1-7, 2009 | 10 | 2009 |
| Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system R Sleik, M Glavanovics, Y Nikitin, M Di Bernardo, A Muetze, K Krischan 2017 19th European Conference on Power Electronics and Applications (EPE'17 …, 2017 | 4 | 2017 |
| A compact high current system for short circuit testing of smart power switches according to AEC standard Q100-012 M Glavanovics, R Sleik, C Schreiber 2008 IEEE Power Electronics Specialists Conference, 1828-1832, 2008 | 4 | 2008 |
Michael GlavanovicsKAI Kompetenzzentrum Automobil- und IndustrieelektronikVerified email at k-ai.at
