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Lizhou Wu
Lizhou Wu
Delf University of Technology
Bestätigte E-Mail-Adresse bei tudelft.nl - Startseite
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Jahr
Device-aware test: A new test approach towards DPPB level
M Fieback, L Wu, GC Medeiros, H Aziza, S Rao, EJ Marinissen, M Taouil, ...
2019 IEEE International Test Conference (ITC), 1-10, 2019
522019
Electrical modeling of STT-MRAM defects
L Wu, M Taouil, S Rao, EJ Marinissen, S Hamdioui
2018 IEEE International Test Conference (ITC), 1-10, 2018
402018
Pinhole defect characterization and fault modeling for STT-MRAM testing
L Wu, S Rao, GC Medeiros, M Taouil, EJ Marinissen, F Yasin, S Couet, ...
2019 IEEE European Test Symposium (ETS), 1-6, 2019
252019
Defect and fault modeling framework for STT-MRAM testing
L Wu, S Rao, M Taouil, GC Medeiros, M Fieback, EJ Marinissen, GS Kar, ...
IEEE Transactions on Emerging Topics in Computing 9 (2), 707-723, 2019
242019
Defects, fault modeling, and test development framework for RRAMs
M Fieback, GC Medeiros, L Wu, H Aziza, R Bishnoi, M Taouil, S Hamdioui
ACM Journal on Emerging Technologies in Computing Systems (JETC) 18 (3), 1-26, 2022
172022
Survey on STT-MRAM testing: Failure mechanisms, fault models, and tests
L Wu, M Taouil, S Rao, EJ Marinissen, S Hamdioui
arXiv preprint arXiv:2001.05463, 2020
172020
Impact of magnetic coupling and density on STT-MRAM performance
L Wu, S Rao, M Taouil, EJ Marinissen, GS Kar, S Hamdioui
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2020
142020
Special session–emerging memristor based memory and CIM architecture: Test, repair and yield analysis
R Bishnoi, L Wu, M Fieback, C Münch, SM Nair, M Tahoori, Y Wang, H Li, ...
2020 IEEE 38th VLSI Test Symposium (VTS), 1-10, 2020
122020
Characterization, modeling and test of synthetic anti-ferromagnet flip defect in STT-MRAMs
L Wu, S Rao, M Taouil, EJ Marinissen, GS Kar, S Hamdioui
2020 IEEE International Test Conference (ITC), 1-10, 2020
112020
Hard-to-detect fault analysis in finfet srams
GC Medeiros, M Fieback, L Wu, M Taouil, LMB Poehls, S Hamdioui
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (6 …, 2021
102021
Gemini: a novel hardware and software implementation of high-performance PCIe SSD
Y Ou, N Xiao, F Liu, Z Chen, W Chen, L Wu
International Journal of Parallel Programming 45, 923-945, 2017
92017
Recent trends and perspectives on defect-oriented testing
P Bernardi, R Cantoro, A Coyette, W Dobbeleare, M Fieback, A Floridia, ...
2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022
62022
Characterization, modeling, and test of intermediate state defects in STT-MRAMs
L Wu, S Rao, M Taouil, EJ Marinissen, GS Kar, S Hamdioui
IEEE Transactions on Computers 71 (9), 2219-2233, 2021
62021
Testing STT-MRAM: Manufacturing defects, fault models, and test solutions
L Wu, S Rao, M Taouil, EJ Marinissen, GS Kar, S Hamdioui
2021 IEEE International Test Conference (ITC), 143-152, 2021
62021
RHS-TRNG: A Resilient High-Speed True Random Number Generator Based on STT-MTJ Device
S Fu, T Li, C Zhang, H Li, S Ma, J Zhang, R Zhang, L Wu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023
52023
Characterization and fault modeling of intermediate state defects in STT-MRAM
L Wu, S Rao, M Taouil, EJ Marinissen, GS Kar, S Hamdioui
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021
52021
A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
GC Medeiros, CC Gürsoy, L Wu, M Fieback, M Jenihhin, M Taouil, ...
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 792-797, 2020
52020
MFA-MTJ model: Magnetic-field-aware compact model of pMTJ for robust STT-MRAM design
L Wu, S Rao, M Taouil, EJ Marinissen, GS Kar, S Hamdioui
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022
42022
Special session: Stt-mrams: Technology, design and test
A Gebregiorgis, L Wu, C Münch, S Rao, MB Tahoori, S Hamdioui
2022 IEEE 40th VLSI Test Symposium (VTS), 1-10, 2022
32022
Device-aware test for emerging memories: Enabling your test program for DPPB level
L Wu, M Fieback, M Taouil, S Hamdioui
2020 IEEE European Test Symposium (ETS), 1-2, 2020
32020
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