Julie Cairney
Julie Cairney
Bestätigte E-Mail-Adresse bei sydney.edu.au
Titel
Zitiert von
Zitiert von
Jahr
Atom probe microscopy
B Gault, MP Moody, JM Cairney, SP Ringer
Springer Science & Business Media, 2012
8902012
Cu 2 ZnSnS 4 solar cells with over 10% power conversion efficiency enabled by heterojunction heat treatment
C Yan, J Huang, K Sun, S Johnston, Y Zhang, H Sun, A Pu, M He, F Liu, ...
Nature Energy 3 (9), 764-772, 2018
3912018
Long-chain terminal alcohols through catalytic CO hydrogenation
Y Xiang, V Chitry, P Liddicoat, P Felfer, J Cairney, S Ringer, N Kruse
Journal of the American Chemical Society 135 (19), 7114-7117, 2013
1522013
Characterizing deformed ultrafine-grained and nanocrystalline materials using transmission Kikuchi diffraction in a scanning electron microscope
PW Trimby, Y Cao, Z Chen, S Han, KJ Hemker, J Lian, X Liao, ...
Acta Materialia 62, 69-80, 2014
1482014
Nanocomposite Ti–Si–N, Zr–Si–N, Ti–Al–Si–N, Ti–Al–V–Si–N thin film coatings deposited by vacuum arc deposition
PJ Martin, A Bendavid, JM Cairney, M Hoffman
Surface and Coatings Technology 200 (7), 2228-2235, 2005
1432005
Atom probe crystallography
B Gault, MP Moody, JM Cairney, SP Ringer
Materials Today 15 (9), 378-386, 2012
1342012
A reproducible method for damage‐free site‐specific preparation of atom probe tips from interfaces
PJ Felfer, T Alam, SP Ringer, JM Cairney
Microscopy research and technique 75 (4), 484-491, 2012
1322012
Microstructural evolution during ageing of Al–Cu–Li–x alloys
V Araullo-Peters, B Gault, F De Geuser, A Deschamps, JM Cairney
Acta Materialia 66, 199-208, 2014
1272014
Observations of grain boundary impurities in nanocrystalline Al and their influence on microstructural stability and mechanical behaviour
F Tang, DS Gianola, MP Moody, KJ Hemker, JM Cairney
Acta Materialia 60 (3), 1038-1047, 2012
1182012
Deformation-induced trace element redistribution in zircon revealed using atom probe tomography
S Piazolo, A La Fontaine, P Trimby, S Harley, L Yang, R Armstrong, ...
Nature communications 7 (1), 1-7, 2016
1152016
Effect of ion irradiation on tensile ductility, strength and fictive temperature in metallic glass nanowires
DJ Magagnosc, G Kumar, J Schroers, P Felfer, JM Cairney, DS Gianola
Acta Materialia 74, 165-182, 2014
1152014
New insights into the phase transformations to isothermal ω and ω-assisted α in near β-Ti alloys
T Li, D Kent, G Sha, LT Stephenson, AV Ceguerra, SP Ringer, ...
Acta Materialia 106, 353-366, 2016
1142016
Transmission Kikuchi diffraction in a scanning electron microscope: A review
GC Sneddon, PW Trimby, JM Cairney
Materials Science and Engineering: R: Reports 110, 1-12, 2016
1112016
Phase Stability of t′‐Zirconia‐Based Thermal Barrier Coatings: Mechanistic Insights
JA Krogstad, S Krämer, DM Lipkin, CA Johnson, DRG Mitchell, ...
Journal of the American Ceramic Society 94, s168-s177, 2011
1072011
Measurements of atmospheric parameters during Indian Space Research Organization Geosphere Biosphere Programme Land Campaign II at a typical location in the Ganga basin: 1 …
SN Tripathi, V Tare, N Chinnam, AK Srivastava, S Dey, A Agarwal, ...
Journal of Geophysical Research: Atmospheres 111 (D23), 2006
1062006
Reducing the macroparticle content of cathodic arc evaporated TiN coatings
SG Harris, ED Doyle, YC Wong, PR Munroe, JM Cairney, JM Long
Surface and Coatings Technology 183 (2-3), 283-294, 2004
1002004
Penetration of protective chromia scales by carbon
DJ Young, TD Nguyen, P Felfer, J Zhang, JM Cairney
Scripta Materialia 77, 29-32, 2014
912014
Synthesis and performance evaluation of thin film PPy-PVDF multilayer electroactive polymer actuators
B Gaihre, G Alici, GM Spinks, JM Cairney
Sensors and Actuators A: Physical 165 (2), 321-328, 2011
882011
Atom probe specimen fabrication methods using a dual FIB/SEM
DW Saxey, JM Cairney, D McGrouther, T Honma, SP Ringer
Ultramicroscopy 107 (9), 756-760, 2007
852007
On the multiplicity of field evaporation events in atom probe: A new dimension to the analysis of mass spectra
L Yao, B Gault, JM Cairney, SP Ringer
Philosophical Magazine Letters 90 (2), 121-129, 2010
842010
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