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Co-authors
- Khaled B. LetaiefMember of US National Academy of Engineering and New Bright Professor of Engineering, HKUSTVerified email at ust.hk
- Jun ZhangHong Kong University of Science and Technology, IEEE FellowVerified email at ust.hk
- Li CHEN 陈力Beijing Zhongguancun LaboratoryVerified email at zgclab.edu.cn
- Dr. Bo BaiTheory Lab, Central Research Institute, 2012 Labs, Huawei Technologies Co., Ltd.Verified email at huawei.com
- Yuanming ShiProfessor, ShanghaiTech UniversityVerified email at shanghaitech.edu.cn
- Hong XuAssociate Professor, Computer Science and Engineering, Chinese University of Hong KongVerified email at cuhk.edu.hk
- Baochun LiProfessor of Electrical and Computer Engineering, University of TorontoVerified email at ece.toronto.edu
- Don TowsleyUniversity of MassachusettsVerified email at cs.umass.edu
- Shuang WuNoah's Ark Lab HuaweiVerified email at connect.ust.hk
- Xinyun ChenChinese University of Hong Kong, ShenzhenVerified email at cuhk.edu.cn