Minimising damage in high resolution scanning transmission electron microscope images of nanoscale structures and processes D Nicholls, J Lee, H Amari, AJ Stevens, BL Mehdi, ND Browning Nanoscale 12 (41), 21248-21254, 2020 | 42 | 2020 |
Controlling radiolysis chemistry on the nanoscale in liquid cell scanning transmission electron microscopy J Lee, D Nicholls, ND Browning, BL Mehdi Physical Chemistry Chemical Physics 23 (33), 17766-17773, 2021 | 22 | 2021 |
Sub-sampled imaging for STEM: Maximising image speed, resolution and precision through reconstruction parameter refinement D Nicholls, J Wells, A Stevens, Y Zheng, J Castagna, ND Browning Ultramicroscopy 233, 113451, 2022 | 21 | 2022 |
Roadmap for a sustainable circular economy in lithium-ion and future battery technologies GDJ Harper, E Kendrick, PA Anderson, W Mrozik, P Christensen, ... Journal of Physics: Energy 5 (2), 021501, 2023 | 14 | 2023 |
Compressive scanning transmission electron microscopy D Nicholls, A Robinson, J Wells, A Moshtaghpour, M Bahri, A Kirkland, ... ICASSP 2022-2022 IEEE International Conference on Acoustics, Speech and …, 2022 | 9 | 2022 |
High temporal-resolution scanning transmission electron microscopy using sparse-serpentine scan pathways E Ortega, D Nicholls, ND Browning, N de Jonge Scientific Reports 11 (1), 22722, 2021 | 7 | 2021 |
SIM-STEM Lab: Incorporating compressed sensing theory for fast STEM simulation AW Robinson, D Nicholls, J Wells, A Moshtaghpour, A Kirkland, ... Ultramicroscopy 242, 113625, 2022 | 6 | 2022 |
A targeted sampling strategy for compressive cryo focused ion beam scanning electron microscopy D Nicholls, J Wells, AW Robinson, A Moshtaghpour, M Kobylynska, ... ICASSP 2023-2023 IEEE International Conference on Acoustics, Speech and …, 2023 | 5 | 2023 |
The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy ND Browning, J Castagna, AI Kirkland, A Moshtaghpour, D Nicholls, ... Applied Physics Letters 122 (5), 2023 | 3 | 2023 |
Compressed STEM Simulations AW Robinson, D Nicholls, J Wells, A Moshtaghpour, AI Kirkland, ... Microscopy and Microanalysis 28 (S1), 3116-3117, 2022 | 3 | 2022 |
Towards real‐time STEM simulations through targeted subsampling strategies AW Robinson, J Wells, D Nicholls, A Moshtaghpour, M Chi, AI Kirkland, ... Journal of microscopy 290 (1), 53-66, 2023 | 2 | 2023 |
Quantifying the Effects of Beam Overlap on Radiation Damage via Radiolysis Products in the In-situ Liquid (S) TEM Cell J Lee, D Nicholls, N Browning, BL Mehdi Microscopy and Microanalysis 26 (S2), 2572-2574, 2020 | 2 | 2020 |
Optimal Sampling and Reconstruction Strategies for Scanning Microscopes ND Browning, D Nicholls, J Wells, AW Robinson Electronic Device Failure Analysis 24 (1), 11-16, 2022 | 1 | 2022 |
Understanding and Controlling E-beam Damage in Operando EC-STEM BL Mehdi, W Li, J Lee, D Nicholls, N Browning, A Stevens Microscopy and Microanalysis 26 (S2), 3068-3069, 2020 | 1 | 2020 |
Low-dose and high-speed observations of battery processes by operando STEM BL Mehdi, ND Browning, J Lee, H Amari, N Johnson, D Nicholls, ... Microscopy and Microanalysis 25 (S2), 1454-1455, 2019 | 1 | 2019 |
The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging and Tomography D Nicholls, M Kobylysnka, J Wells, Z Broad, D McGrouther, RA Fleck, ... arXiv preprint arXiv:2309.09617, 2023 | | 2023 |
Fast STEM Simulation Technique to Improve Quality of Inpainted Experimental Images Through Dictionary Transfer AW Robinson, D Nicholls, J Wells, A Moshtaghpour, M Chi, AI Kirkland, ... Microscopy and Microanalysis 29 (Supplement_1), 681-682, 2023 | | 2023 |
Compressive Cryo FIB-SEM Tomography D Nicholls, J Wells, AW Robinson, A Moshtaghpour, M Kobylynska, ... Microscopy and Microanalysis 29 (Supplement_1), 526-527, 2023 | | 2023 |
N-Dimensional Dictionary Learning for Hyperspectral Scanning (Transmission) Electron Microscopy J Wells, D Nicholls, AW Robinson, A Moshtaghpour, Y Zheng, J Castagna, ... Microscopy and Microanalysis 29 (Supplement_1), 1887-1888, 2023 | | 2023 |
Subsampling Methods for Fast Electron Backscattered Diffraction Analysis for SEM Z Broad, D Nicholls, J Wells, A Moshtaghpour, AW Robinson, R Masters, ... Microscopy and Microanalysis 29 (Supplement_1), 467-469, 2023 | | 2023 |