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Daniel Nicholls
Daniel Nicholls
Bestätigte E-Mail-Adresse bei liverpool.ac.uk
Titel
Zitiert von
Zitiert von
Jahr
Minimising damage in high resolution scanning transmission electron microscope images of nanoscale structures and processes
D Nicholls, J Lee, H Amari, AJ Stevens, BL Mehdi, ND Browning
Nanoscale 12 (41), 21248-21254, 2020
422020
Controlling radiolysis chemistry on the nanoscale in liquid cell scanning transmission electron microscopy
J Lee, D Nicholls, ND Browning, BL Mehdi
Physical Chemistry Chemical Physics 23 (33), 17766-17773, 2021
222021
Sub-sampled imaging for STEM: Maximising image speed, resolution and precision through reconstruction parameter refinement
D Nicholls, J Wells, A Stevens, Y Zheng, J Castagna, ND Browning
Ultramicroscopy 233, 113451, 2022
212022
Roadmap for a sustainable circular economy in lithium-ion and future battery technologies
GDJ Harper, E Kendrick, PA Anderson, W Mrozik, P Christensen, ...
Journal of Physics: Energy 5 (2), 021501, 2023
142023
Compressive scanning transmission electron microscopy
D Nicholls, A Robinson, J Wells, A Moshtaghpour, M Bahri, A Kirkland, ...
ICASSP 2022-2022 IEEE International Conference on Acoustics, Speech and …, 2022
92022
High temporal-resolution scanning transmission electron microscopy using sparse-serpentine scan pathways
E Ortega, D Nicholls, ND Browning, N de Jonge
Scientific Reports 11 (1), 22722, 2021
72021
SIM-STEM Lab: Incorporating compressed sensing theory for fast STEM simulation
AW Robinson, D Nicholls, J Wells, A Moshtaghpour, A Kirkland, ...
Ultramicroscopy 242, 113625, 2022
62022
A targeted sampling strategy for compressive cryo focused ion beam scanning electron microscopy
D Nicholls, J Wells, AW Robinson, A Moshtaghpour, M Kobylynska, ...
ICASSP 2023-2023 IEEE International Conference on Acoustics, Speech and …, 2023
52023
The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy
ND Browning, J Castagna, AI Kirkland, A Moshtaghpour, D Nicholls, ...
Applied Physics Letters 122 (5), 2023
32023
Compressed STEM Simulations
AW Robinson, D Nicholls, J Wells, A Moshtaghpour, AI Kirkland, ...
Microscopy and Microanalysis 28 (S1), 3116-3117, 2022
32022
Towards real‐time STEM simulations through targeted subsampling strategies
AW Robinson, J Wells, D Nicholls, A Moshtaghpour, M Chi, AI Kirkland, ...
Journal of microscopy 290 (1), 53-66, 2023
22023
Quantifying the Effects of Beam Overlap on Radiation Damage via Radiolysis Products in the In-situ Liquid (S) TEM Cell
J Lee, D Nicholls, N Browning, BL Mehdi
Microscopy and Microanalysis 26 (S2), 2572-2574, 2020
22020
Optimal Sampling and Reconstruction Strategies for Scanning Microscopes
ND Browning, D Nicholls, J Wells, AW Robinson
Electronic Device Failure Analysis 24 (1), 11-16, 2022
12022
Understanding and Controlling E-beam Damage in Operando EC-STEM
BL Mehdi, W Li, J Lee, D Nicholls, N Browning, A Stevens
Microscopy and Microanalysis 26 (S2), 3068-3069, 2020
12020
Low-dose and high-speed observations of battery processes by operando STEM
BL Mehdi, ND Browning, J Lee, H Amari, N Johnson, D Nicholls, ...
Microscopy and Microanalysis 25 (S2), 1454-1455, 2019
12019
The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging and Tomography
D Nicholls, M Kobylysnka, J Wells, Z Broad, D McGrouther, RA Fleck, ...
arXiv preprint arXiv:2309.09617, 2023
2023
Fast STEM Simulation Technique to Improve Quality of Inpainted Experimental Images Through Dictionary Transfer
AW Robinson, D Nicholls, J Wells, A Moshtaghpour, M Chi, AI Kirkland, ...
Microscopy and Microanalysis 29 (Supplement_1), 681-682, 2023
2023
Compressive Cryo FIB-SEM Tomography
D Nicholls, J Wells, AW Robinson, A Moshtaghpour, M Kobylynska, ...
Microscopy and Microanalysis 29 (Supplement_1), 526-527, 2023
2023
N-Dimensional Dictionary Learning for Hyperspectral Scanning (Transmission) Electron Microscopy
J Wells, D Nicholls, AW Robinson, A Moshtaghpour, Y Zheng, J Castagna, ...
Microscopy and Microanalysis 29 (Supplement_1), 1887-1888, 2023
2023
Subsampling Methods for Fast Electron Backscattered Diffraction Analysis for SEM
Z Broad, D Nicholls, J Wells, A Moshtaghpour, AW Robinson, R Masters, ...
Microscopy and Microanalysis 29 (Supplement_1), 467-469, 2023
2023
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