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Rupert Schlick
Rupert Schlick
Verified email at ait.ac.at
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Year
Killing strategies for model‐based mutation testing
BK Aichernig, H Brandl, E Jöbstl, W Krenn, R Schlick, S Tiran
Software Testing, Verification and Reliability 25 (8), 716-748, 2015
872015
Momut:: UML model-based mutation testing for UML
W Krenn, R Schlick, S Tiran, B Aichernig, E Jobstl, H Brandl
2015 IEEE 8th International Conference on Software Testing, Verification and …, 2015
782015
Model-based mutation testing of an industrial measurement device
BK Aichernig, J Auer, E Jöbstl, R Korošec, W Krenn, R Schlick, ...
International Conference on Tests and Proofs, 1-19, 2014
492014
Mapping UML to labeled transition systems for test-case generation
W Krenn, R Schlick, BK Aichernig
International Symposium on Formal Methods for Components and Objects, 186-207, 2009
362009
Model-based, mutation-driven test-case generation via heuristic-guided branching search
A Fellner, W Krenn, R Schlick, T Tarrach, G Weissenbacher
ACM Transactions on Embedded Computing Systems (TECS) 18 (1), 1-28, 2019
342019
Integration of requirements engineering and test-case generation via OSLC
BK Aichernig, K Hörmaier, F Lorber, D Nickovic, R Schlick, D Simoneau, ...
2014 14th international conference on quality software, 117-126, 2014
312014
Fault-based generation of test cases from UML-models–approach and some experiences
R Schlick, W Herzner, E Jöbstl
International Conference on Computer Safety, Reliability, and Security, 270-283, 2011
202011
Model-based development of distributed embedded real-time systems with the decos tool-chain
W Herzner, R Schlick, M Schlager, B Leiner, B Huber, A Balogh, ...
proc. of 2007 SAE AeroTech Congress & Exhibition, 2007
192007
Learning and statistical model checking of system response times
BK Aichernig, P Bauerstätter, E Jöbstl, S Kann, R Korošec, W Krenn, ...
Software Quality Journal 27 (2), 757-795, 2019
102019
Behaviour-driven formal model development
C Snook, TS Hoang, D Dghyam, M Butler, T Fischer, R Schlick, K Wang
International Conference on Formal Engineering Methods, 21-36, 2018
102018
A proposal of an example and experiments repository to foster industrial adoption of formal methods
R Schlick, M Felderer, I Majzik, R Nardone, A Raschke, C Snook, ...
International Symposium on Leveraging Applications of Formal Methods, 249-272, 2018
102018
Checking response-time properties of web-service applications under stochastic user profiles
R Schumi, P Lang, BK Aichernig, W Krenn, R Schlick
IFIP International Conference on Testing Software and Systems, 293-310, 2017
102017
The VALU3S ECSEL project: verification and validation of automated systems safety and security
R Barbosa, S Basagiannis, G Giantamidis, H Becker, E Ferrari, J Jahic, ...
2020 23rd Euromicro Conference on Digital System Design (DSD), 352-359, 2020
82020
Mutation-driven Test Case Generation Using Short-lived Concurrent Mutants--First Results
W Krenn, R Schlick
arXiv preprint arXiv:1601.06974, 2016
62016
Checking SCADE models for correct usage of physical units
R Schlick, W Herzner, TL Sergent
International Conference on Computer Safety, Reliability, and Security, 358-371, 2006
62006
The VALU3S ECSEL project: Verification and validation of automated systems safety and security
JA Agirre, L Etxeberria, R Barbosa, S Basagiannis, G Giantamidis, ...
Microprocessors and microsystems 87, 104349, 2021
52021
A process to facilitate automated automotive cybersecurity testing
S Marksteiner, N Marko, A Smulders, S Karagiannis, F Stahl, ...
2021 IEEE 93rd Vehicular Technology Conference (VTC2021-Spring), 1-7, 2021
52021
Towards fault-based generation of test cases for dependable embedded software
W Herzner, R Schlick, HB Ait Austrian, J Wiessalla
52011
A Proposal for the Classification of Methods for Verification and Validation of Safety, Cybersecurity, and Privacy of Automated Systems.
JL de la Vara, T Bauer, B Fischer, M Karaca, H Madeira, M Matschnig, ...
QUATIC, 325-340, 2021
42021
Towards generation of efficient test cases from UML/OCL models for complex safety-critical systems
W Herzner, R Schlick, W Schütz, H Brandl, W Krenn
e & i Elektrotechnik und Informationstechnik 127 (6), 181-186, 2010
32010
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