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Sriramkumar Venugopalan
Sriramkumar Venugopalan
Semiconductors Professional
Bestätigte E-Mail-Adresse bei eecs.berkeley.edu
Titel
Zitiert von
Zitiert von
Jahr
FinFET Modeling for IC Simulation and Design: Using the BSIM-CMG Standard
YS Chauhan, DD Lu, V Sriramkumar, S Khandelwal, JP Duarte, ...
Academic Press, 2015
2272015
BSIM—SPICE models enable FinFET and UTB IC designs
N Paydavosi, S Venugopalan, YS Chauhan, JP Duarte, S Jandhyala, ...
IEEE Access 1, 201-215, 2013
1352013
BSIM6: Analog and RF compact model for bulk MOSFET
YS Chauhan, S Venugopalan, MA Chalkiadaki, MAU Karim, H Agarwal, ...
IEEE Transactions on Electron Devices 61 (2), 234-244, 2013
1322013
BSIM-IMG: A compact model for ultrathin-body SOI MOSFETs with back-gate control
S Khandelwal, YS Chauhan, DD Lu, S Venugopalan, MAU Karim, ...
IEEE Transactions on Electron Devices 59 (8), 2019-2026, 2012
1122012
Dielectric properties of dysprosium-and scandium-doped hafnium dioxide thin films
C Adelmann, V Sriramkumar, S Van Elshocht, P Lehnen, T Conard, ...
Applied Physics Letters 91 (16), 162902, 2007
1042007
BSIM—Industry standard compact MOSFET models
YS Chauhan, S Venugopalan, MA Karim, S Khandelwal, N Paydavosi, ...
ESSCIRC (ESSCIRC), 2012 Proceedings of the, 30-33, 2012
822012
Extraction of isothermal condition and thermal network in UTBB SOI MOSFETs
MA Karim, YS Chauhan, S Venugopalan, AB Sachid, DD Lu, BY Nguyen, ...
IEEE Electron Device Letters 33 (9), 1306-1308, 2012
522012
Unified FinFET compact model: modelling trapezoidal triple-gate FinFETs
JP Duarte, N Paydavosi, S Venugopalan, A Sachid, C Hu
2013 International Conference on Simulation of Semiconductor Processes and …, 2013
402013
BSIM compact MOSFET models for SPICE simulation
YS Chauhan, S Venugopalan, N Paydavosi, P Kushwaha, S Jandhyala, ...
Proceedings of the 20th International Conference Mixed Design of Integrated …, 2013
362013
SAMURAI: An accurate method for modelling and simulating non-stationary random telegraph noise in SRAMs
KV Aadithya, A Demir, S Venugopalan, J Roychowdhury
2011 Design, Automation & Test in Europe, 1-6, 2011
362011
MUSTARD: A coupled, stochastic/deterministic, discrete/continuous technique for predicting the impact of Random Telegraph Noise on SRAMs and DRAMs
K Aadithya, S Venogopalan, A Demir, J Roychowdhury
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE, 292-297, 2011
352011
BSIM-CG: A compact model of cylindrical/surround gate MOSFET for circuit simulations
S Venugopalan, DD Lu, Y Kawakami, PM Lee, AM Niknejad, C Hu
Solid-State Electronics 67 (1), 79-89, 2012
342012
A Dynamically Biased Multiband 2G/3G/4G Cellular Transmitter in 28 nm CMOS
S Seth, DH Kwon, S Venugopalan, SW Son, Y Zuo, V Bhagavatula, J Lim, ...
IEEE Journal of Solid-State Circuits 51 (5), 1096-1108, 2016
312016
Recent enhancements in BSIM6 bulk MOSFET model
H Agarwal, S Venugopalan, MA Chalkiadaki, N Paydavosi, JP Duarte, ...
2013 International Conference on Simulation of Semiconductor Processes and …, 2013
302013
Accurate prediction of random telegraph noise effects in SRAMs and DRAMs
KV Aadithya, A Demir, S Venugopalan, J Roychowdhury
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012
292012
Phenomenological compact model for QM charge centroid in multigate FETs
S Venugopalan, MA Karim, S Salahuddin, AM Niknejad, CC Hu
IEEE Transactions on Electron Devices 60 (4), 1480-1484, 2013
272013
BSIM-CMG 110.0. 0: Multi-gate MOSFET compact model: technical manual
S Khandelwal, JP Duarte, AS Medury, S Venugopalan, N Paydavosi, ...
BSIM Group UC Berkeley, 2015
252015
BSIM6: Symmetric bulk MOSFET model
YS Chauhan, MA Karim, S Venugopalan, S Khandelwal, P Thakur, ...
Workshop on Compact Modeling, 2012
222012
BSIM-CMG 107.0. 0: Multi-Gate MOSFET Compact Model (Technical Manual)
V Sriramkumar, N Paydavosi, J Duarte, D Lu, CH Lin, M Dunga, S Yao, ...
Dept. of Electrical Engineering and Computer Sciences, Univ. of California …, 2013
172013
Global parameter extraction for a multi-gate MOSFETs compact model
S Yao, TH Morshed, DD Lu, S Venugopalan, W Xiong, CR Cleavelin, ...
2010 International Conference on Microelectronic Test Structures (ICMTS …, 2010
172010
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