| Comprehensive study of soft errors in advanced CMOS circuits with 90/130 nm technology Y Tosaka, H Ehara, M Igeta, T Uemura, H Oka, N Matsuoka, K Hatanaka IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 …, 2004 | 89 | 2004 |
| SEILA: Soft error immune latch for mitigating multi-node-SEU and local-clock-SET T Uemura, Y Tosaka, H Matsuyama, K Shono, CJ Uchibori, K Takahisa, ... 2010 IEEE International Reliability Physics Symposium, 218-223, 2010 | 58 | 2010 |
| Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system S Abe, Y Watanabe, N Shibano, N Sano, H Furuta, M Tsutsui, T Uemura, ... IEEE Transactions on Nuclear Science 59 (4), 965-970, 2012 | 41 | 2012 |
| Reliability characterization of 10nm FinFET technology with multi-VT gate stack for low power and high performance M Jin, C Liu, J Kim, J Kim, H Shim, K Kim, G Kim, S Lee, T Uemura, ... 2016 IEEE International Electron Devices Meeting (IEDM), 15.1. 1-15.1. 4, 2016 | 33 | 2016 |
| Neutron-induced soft-error simulation technology for logic circuits T Uemura, Y Tosaka, S Satoh Japanese journal of applied physics 45 (4S), 3256, 2006 | 31 | 2006 |
| Neutron-induced soft-error simulation technology for logic circuits T Uemura, Y Tosaka, S Satoh Japanese journal of applied physics 45 (4S), 3256, 2006 | 31 | 2006 |
| Soft-error in SRAM at ultra-low voltage and impact of secondary proton in terrestrial environment T Uemura, T Kato, H Matsuyama, M Hashimoto IEEE Transactions on Nuclear Science 60 (6), 4232-4237, 2013 | 25 | 2013 |
| The 10th generation 16-core sparc64™ processor for mission critical unix server R Kan, T Tanaka, G Sugizaki, K Ishizaka, R Nishiyama, S Sakabayashi, ... IEEE Journal of Solid-State Circuits 49 (1), 32-40, 2013 | 25 | 2013 |
| A 10th generation 16-core SPARC64 processor for mission-critical UNIX server R Kan, T Tanaka, G Sugizaki, R Nishiyama, S Sakabayashi, Y Koyanagi, ... 2013 IEEE International Solid-State Circuits Conference Digest of Technical …, 2013 | 25 | 2013 |
| Angular dependency of neutron-induced multiple cell upsets in 65-nm 10T subthreshold SRAM R Harada, SI Abe, H Fuketa, T Uemura, M Hashimoto, Y Watanabe IEEE Transactions on Nuclear Science 59 (6), 2791-2795, 2012 | 25 | 2012 |
| Investigation of logic circuit soft error rate (SER) in 14nm FinFET technology T Uemura, S Lee, J Park, S Pae, H Lee 2016 IEEE International Reliability Physics Symposium (IRPS), 3B-4-1-3B-4-4, 2016 | 24 | 2016 |
| Neutron-induced soft error analysis in MOSFETs from a 65nm to a 25 nm design rule using multi-scale Monte Carlo simulation method S Abe, Y Watanabe, N Shibano, N Sano, H Furuta, M Tsutsui, T Uemura, ... 2012 IEEE International Reliability Physics Symposium (IRPS), SE. 3.1-SE. 3.6, 2012 | 23 | 2012 |
| Measurement of neutron-induced single event transient pulse width narrower than 100ps H Nakamura, K Tanaka, T Uemura, K Takeuchi, T Fukuda, S Kumashiro 2010 IEEE International Reliability Physics Symposium, 694-697, 2010 | 22 | 2010 |
| Scaling effect and circuit type dependence of neutron induced single event transient H Nakamura, T Uemura, K Takeuchi, T Fukuda, S Kumashiro, T Mogami 2012 IEEE International Reliability Physics Symposium (IRPS), 3C. 3.1-3C. 3.7, 2012 | 20 | 2012 |
| Using low pass filters in mitigation techniques against single-event transients in 45nm technology LSIs T Uemura, R Tanabe, Y Tosaka, S Satoh 2008 14th IEEE International On-Line Testing Symposium, 117-122, 2008 | 19 | 2008 |
| Technology Scaling Trend of Soft Error Rate in Flip-Flops innm Bulk FinFET Technology T Uemura, S Lee, U Monga, J Choi, S Lee, S Pae IEEE Transactions on Nuclear Science 65 (6), 1255-1263, 2018 | 17 | 2018 |
| Reliability of 8Mbit embedded-STT-MRAM in 28nm FDSOI technology Y Ji, HJ Goo, J Lim, SB Lee, S Lee, T Uemura, JC Park, SI Han, SC Shin, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-3, 2019 | 16 | 2019 |
| Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit T Uemura, S Lee, D Min, I Moon, J Lim, S Lee, HC Sagong, S Pae 2018 IEEE International Reliability Physics Symposium (IRPS), P-SE. 1-1-P-SE …, 2018 | 15 | 2018 |
| Origin analysis of thermal neutron soft error rate at nanometer scale T Yamazaki, T Kato, T Uemura, H Matsuyama, Y Tada, K Yamazaki, ... Journal of Vacuum Science & Technology B 33 (2), 2015 | 14 | 2015 |
| Study on influence of device structure dimensions and profiles on charge collection current causing SET pulse leading to soft errors in logic circuits K Tanaka, H Nakamura, T Uemura, K Takeuchi, T Fukuda, S Kumashiro 2009 International Conference on Simulation of Semiconductor Processes and …, 2009 | 14 | 2009 |
Soonyoung LeeSamsung electronicsVerified email at samsung.com
