Matteo SONZA REORDA
Matteo SONZA REORDA
Politecnico di Torino, Dept. of Control and Computer Engineering
Verified email at polito.it - Homepage
Title
Cited by
Cited by
Year
RT-level ITC'99 benchmarks and first ATPG results
F Corno, MS Reorda, G Squillero
IEEE Design & Test of computers 17 (3), 44-53, 2000
5122000
Soft-error detection using control flow assertions
O Goloubeva, M Rebaudengo, MS Reorda, M Violante
Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSIá…, 2003
2902003
On the optimal design of triple modular redundancy logic for SRAM-based FPGAs
FL Kastensmidt, L Sterpone, L Carro, MS Reorda
Design, Automation and Test in Europe, 1290-1295, 2005
2652005
Microprocessor software-based self-testing
M Psarakis, D Gizopoulos, E Sanchez, MS Reorda
IEEE Design & Test of Computers 27 (3), 4-19, 2010
2532010
Soft-error detection through software fault-tolerance techniques
M Rebaudengo, MS Reorda, M Torchiano, M Violante
Proceedings 1999 IEEE International Symposium on Defect and Fault Toleranceá…, 1999
1971999
Software-implemented hardware fault tolerance
O Goloubeva, M Rebaudengo, MS Reorda, M Violante
Springer Science & Business Media, 2006
1722006
Automatic test program generation: a case study
F Corno, E Sßnchez, MS Reorda, G Squillero
IEEE Design & Test of Computers 21 (2), 102-109, 2004
1692004
GATTO: A genetic algorithm for automatic test pattern generation for large synchronous sequential circuits
F Corno, P Prinetto, M Rebaudengo, MS Reorda
IEEE Transactions on Computer-Aided Design of Integrated Circuits andá…, 1996
1661996
Low power BIST via non-linear hybrid cellular automata
F Corno, M Rebaudengo, MS Reorda, G Squillero, M Violante
Proceedings 18th IEEE VLSI Test Symposium, 29-34, 2000
1582000
Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs
M Ceschia, M Violante, MS Reorda, A Paccagnella, P Bernardi, ...
IEEE Transactions on Nuclear Science 50 (6), 2088-2094, 2003
1422003
A test pattern generation methodology for low power consumption
E Corno, P Prinetto, M Rebaudengo, MS Reorda
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No. 98TB100231), 453-457, 1998
1321998
Fully automatic test program generation for microprocessor cores
F Corno, G Cumani, MS Reorda, G Squillero
2003 Design, Automation and Test in Europe Conference and Exhibition, 1006-1011, 2003
1282003
Experimentally evaluating an automatic approach for generating safety-critical software with respect to transient errors
P Cheynet, B Nicolescu, R Velazco, M Rebaudengo, MS Reorda, ...
IEEE Transactions on Nuclear Science 47 (6), 2231-2236, 2000
1272000
A source-to-source compiler for generating dependable software
M Rebaudengo, MS Reorda, M Violante, M Torchiano
Proceedings First IEEE International Workshop on Source Code Analysis andá…, 2001
1222001
A diagnostic test pattern generation algorithm
P Camurati, D Medina, P Prinetto, MS Reorda
Proceedings. International Test Conference 1990, 52-58, 1990
1211990
Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA
M Bellato, P Bernardi, D Bortolato, A Candelori, M Ceschia, ...
Proceedings Design, Automation and Test in Europe Conference and Exhibitioná…, 2004
1162004
An automatic test pattern generator for large sequential circuits based on genetic algorithms
P Prinetto, M Rebaudengo, MS Reorda
Proceedings., International Test Conference, 240-249, 1994
1151994
An FPGA-based approach for speeding-up fault injection campaigns on safety-critical circuits
P Civera, L Macchiarulo, M Rebaudengo, MS Reorda, M Violante
Journal of Electronic Testing 18 (3), 261-271, 2002
1142002
Exploiting circuit emulation for fast hardness evaluation
P Civera, L Macchiarulo, M Rebaudengo, MS Reorda, M Violante
IEEE Transactions on Nuclear Science 48 (6), 2210-2216, 2001
1082001
On the test of microprocessor IP cores
F Corno, MS Reorda, G Squillero, M Violante
Proceedings Design, Automation and Test in Europe. Conference and Exhibitioná…, 2001
1032001
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